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IGB15N60T Просмотр технического описания (PDF) - Unspecified

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IGB15N60T Datasheet PDF : 12 Pages
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IGB15N60T
TRENCHSTOPSeries
q
100ns
10ns
td(on)
t
d(off)
tf
tr
1ns
0A
5A 10A 15A 20A 25A
Figure 9.
IC, COLLECTOR CURRENT
Typical switching times as a
function of collector current
(inductive load, TJ=175°C,
VCE = 400V, VGE = 0/15V, rG = 15Ω,
Dynamic test circuit in Figure E)
td(off)
100ns
tf
td(on)
10ns




tr

RG, GATE RESISTOR
Figure 10. Typical switching times as a
function of gate resistor
(inductive load, TJ = 175°C,
VCE= 400V, VGE = 0/15V, IC = 15A,
Dynamic test circuit in Figure E)
100ns
td(off)
tf
t
d(on)
10ns
tr
25°C 50°C 75°C 100°C 125°C 150°C
TJ, JUNCTION TEMPERATURE
Figure 11. Typical switching times as a
function of junction temperature
(inductive load, VCE = 400V,
VGE = 0/15V, IC = 15A, rG=15Ω,
Dynamic test circuit in Figure E)
7V
6V
max.
typ.
5V
4V min.
3V
2V
1V
0V
-50°C
0°C
50°C 100°C 150°C
TJ, JUNCTION TEMPERATURE
Figure 12. Gate-emitter threshold voltage as
a function of junction
temperature
(IC = 0.21mA)
IFAG IPC TD VLS
6
Rev. 2.6 30.04.2015

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