WS57C291C Просмотр технического описания (PDF) - STMicroelectronics
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WS57C291C Datasheet PDF : 7 Pages
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WS57C191C/291C
ABSOLUTE MAXIMUM RATINGS*
Storage Temperature............................–65° to + 150°C
Voltage on any Pin with
Respect to Ground ....................................–0.6V to +7V
VPP with Respect to Ground...................–0.6V to + 14V
ESD Protection ..................................................>2000V
*NOTICE:
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at these or any other conditions above
those indicated in the operational sections of this
specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of
time may affect device reliability.
MODE SELECTION
PINS
MODE
CS1/ CS2
VPP
CS3
VCC
OUTPUTS
Read
VIL VIH VIH VCC DOUT
Output Disable VIH X X VCC High Z
Output Disable X VIL X VCC High Z
Program
VPP X X VCC
DIN
Program Verify VIL VIH VIH VCC DOUT
Output Disable X X VIL VCC High Z
OPERATING RANGE
RANGE
TEMPERATURE
Commercial
0°C to +70°C
Industrial
–40°C to +85°C
Military
–55°C to +125°C
VCC
+5V ± 10%
+5V ± 10%
+5V ± 10%
DC READ CHARACTERISTICS Over Operating Range. (See Above)
SYMBOL PARAMETER
TEST CONDITIONS
VIL
Input Low Voltage
(Note 3)
VIH
Input High Voltage
(Note 3)
VOL Output Low Voltage IOL = 16 mA
VOH Output High Voltage IOH = –4 mA
ICC1
VCC Active Current
(CMOS)
VCC = 5.5V, f = 0 MHz
(Note 1), Output Not Loaded
Add 2mA/MHz for AC Operation
Comm'l
Industrial
Military
ICC2
VCC Active Current
(TTL)
VCC = 5.5V, f = 0 MHz
(Note 2), Output Not Loaded
Add 2mA/MHz for AC Operation
Comm'l
Industrial
Military
ILI
Input Leakage
Current
VIN = 5.5V or Gnd
ILO
Output Leakage
Current
VOUT = 5.5 V or Gnd
MIN
–0.1
2.0
2.4
–10
–10
MAX UNITS
0.8
V
VCC + 0.3
V
0.4
V
V
30
mA
35
mA
35
mA
40
mA
50
mA
50
mA
10
µA
10
µA
NOTES:
1. CMOS inputs: GND ± 0.3V or VCC ± 0.3V.
2. TTL inputs: VIL ≤ 0.8V, VIH ≥ 2.0V.
3. These are absolute voltages with respect to device ground pin and include all overshoots due to system and/or tester noise.
Do not attempt to test these values without suitable equipment.
2-8
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