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UPD17P228 Просмотр технического описания (PDF) - NEC => Renesas Technology

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UPD17P228 Datasheet PDF : 28 Pages
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µPD17P228
2.4 Processing of Unused Pins
Process the unused pins as follows:
Table 2-1. Processing of Unused Pins
Pin
P0A0-P0A3
P0B0-P0B3
P0C0-P0C3
P0D0-P0D3
P0E0-P0E3
REM
INT
WDOUT
IC1, IC2
Recommended Connection
Connect to VDD.
Connect to VDD.
Connect to GND.
Connect to GND.
Input : Individually connect to VDD or GND via resistor.
Output : Leave open.
Leave open.
Connect to GND.
Connect to VDD via resistor.
These pins cannot be used.
Leave open.
2.5 Notes on Using the RESET and INT Pins
In addition to the functions shown in 2. PIN FUNCTION, the RESET pin also has the function of setting a test mode
(for IC testing) in which the internal operations of the µPD17P228 are tested.
When a voltage higher than VDD is applied to either of these pins, the test mode is set. This means that, even during
normal operation, the µPD17P228 may be set in the test mode if noise exceeding VDD is applied.
For example, if the wiring length of the RESET or INT pin is too long, noise superimposed on the wiring line of the pin
may cause the above problem.
Therefore, keep the wiring length of these pins as short as possible to suppress the noise; otherwise, take noise
preventive measures as shown below by using external components.
Connect diode with low VF between VDD
and RESET/INT pin
Connect capacitor between VDD
and RESET/INT pin
VDD
VDD
Diode with
low VF
VDD
RESET, INT
VDD
RESET, INT
Connect the WDOUT and RESET pins since a low level is output after the test mode is set using the INT pin.
10
Data Sheet U14542EJ1V0DS00

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