UC3842B(2013) Просмотр технического описания (PDF) - ON Semiconductor
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UC3842B Datasheet PDF : 22 Pages
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UC3842B, UC3843B, UC2842B, UC2843B
MAXIMUM RATINGS
Rating
Bias and Driver Voltages (Zero Series Impedance, see also Total Device spec)
Total Power Supply and Zener Current
Output Current, Source or Sink
Output Energy (Capacitive Load per Cycle)
Symbol
VCC, VC
(ICC + IZ)
IO
W
Value
30
30
1.0
5.0
Unit
V
mA
A
mJ
Current Sense, Voltage Feedback, Vref and Rt/Ct Inputs
Compensation
Output
Error Amp Output Sink Current
Power Dissipation and Thermal Characteristics
D Suffix, Plastic Package, SOIC−14 Case 751A
Maximum Power Dissipation @ TA = 25°C
Thermal Resistance, Junction−to−Air
D1 Suffix, Plastic Package, SOIC−8 Case 751
Maximum Power Dissipation @ TA = 25°C
Thermal Resistance, Junction−to−Air
N Suffix, Plastic Package, Case 626
Maximum Power Dissipation @ TA = 25°C
Thermal Resistance, Junction−to−Air
Operating Junction Temperature
Operating Ambient Temperature
UC3842B, UC3843B
UC2842B, UC2843B
UC2843D
UC3842BV, UC3843BV
Vin
Vcomp
Vo
IO
PD
RqJA
PD
RqJA
PD
RqJA
TJ
TA
− 0.3 to + 5.5
V
− 0.3 to + 7.2
V
− 0.3 to VCC or
V
VC + 0.3
10
mA
862
145
702
178
1.25
100
+150
0 to 70
− 25 to + 85
−40 to +85
−40 to +105
mW
°C/W
mW
°C/W
W
°C/W
°C
°C
Storage Temperature Range
Tstg
− 65 to +150
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. This device series contains ESD protection and exceeds the following tests:
Human Body Model 4000 V per JEDEC Standard JESD22-A114B
Machine Model Method 200 V per JEDEC Standard JESD22-A115-A
2. This device contains latch-up protection and exceeds 100 mA per JEDEC Standard JESD78
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