AD1870JR Просмотр технического описания (PDF) - Analog Devices

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AD1870JR

Single-Supply 16-Bit ∑-∆ Stereo ADC

Analog Devices 

AD1870–SPECIFICATIONS

TEST CONDITIONS UNLESS OTHERWISE NOTED

Supply Voltages

5.0

V

Ambient Temperature

25

°C

Input Clock (fCLKIN) [256 × fS]

Input Signal

12.288

991.768

MHz

Hz

–0.5

dB Full Scale

Measurement Bandwidth

23.2 Hz to 19.998 kHz

Load Capacitance on Digital Outputs 50

pF

Input Voltage HI (VIH)

2.4

V

Input Voltage LO (VIL)

0.8

V

Master Mode, Data I2S-Justified (Refer to Figure 14).

Device Under Test (DUT) bypassed and decoupled as shown in Figure 3.

DUT is antialiased and ac-coupled as shown in Figure 2. DUT is calibrated.

Values in bold typeface are tested, all others are guaranteed but not tested.

ANALOG PERFORMANCE

Min

Resolution

Dynamic Range (20 Hz to 20 kHz, –60 dB Input)

Without A-Weight Filter

89

With A-Weight Filter

92

Signal to (THD + Noise)

86.5

Signal to THD

Analog Inputs

Single-Ended Input Range (± Full Scale)*

Input Impedance at Each Input Pin

VREF

2.05

DC Accuracy

Gain Error

Interchannel Gain Mismatch

Gain Drift

Midscale Offset Error (After Calibration)

Midscale Drift

Crosstalk (EIAJ Method)

*VIN p-p = VREF × 1.326.

Minimum

Input

= VREF

–





VREF

× 1.326 

2 

Maximum

Input

= VREF

+





VREF

× 1.326 

2 

Typ

16

93

96

90.5

94

VREF ± 1.49

32

2.25

± 0.5

0.05

115

±3

–0.2

–110

Max

2.55

؎2.5

؎20

–100

Unit

Bits

dB

dB

dB

dB

V

kΩ

V

%

dB

ppm/°C

LSBs

LSB/°C

dB

–2–

REV. 0

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