TLP715 Просмотр технического описания (PDF) - Toshiba
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TLP715 Datasheet PDF : 9 Pages
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TEST CIRCUIT 7: Switching Time Test Circuit
IF=3 mA(P.G)
(f=50 kHz, duty=50%, less than tr = tf = 5ns)
IF
VCC
0.1μF
VO
GND
SHIELD
CL
IF
VCC
VO
CL: stray capacitance of probe and wiring (to 15 pF)
tp LH
1.3V
10%
90%
tr
TLP715
50%
tp HL
90%
tf
VOH
1.3V
10%
VOL
TEST CIRCUIT 8: Switching Time Test Circuit
IF=3 mA(P.G)
(f=50 kHz, duty=50%, less than tr = tf = 5ns)
VCC VO
IF
VCC
0.1μF
5V
620Ω IF
GND
SHIELD
CL 5kΩ
VO
tp LH
1.3V
CL: stray capacitance of probe and wiring (to 15 pF)
50%
tp HL
VOH
1.3V
VOL
TEST CIRCUIT 9: Common-Mode Transient Immunity Test Circuit
→IF
1
SW
AB
2
3
+
6
VCC
5 0.1μF
VO
GND 4
SHIELD
VCM
-
90%
1000V
VCM
10%
tr
VCC
・SW A: I F =5mA
VO
1V
・SW B: I F =0mA
CML
=
800(V)
tr (µs)
tf
CMH
17V
CML
CMH
=
−
800(V)
tf (µs)
Note: CMH (CML) is the maximum rate of rise (fall) of the common mode voltage that can be sustained with the
output voltage in the high (low) state.
© 2019
5
Toshiba Electronic Devices & Storage Corporation
2019-09-25
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