TLP105 Просмотр технического описания (PDF) - Toshiba
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TLP105 Datasheet PDF : 6 Pages
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Recommended Operating Conditions
CHARACTERISTIC
Input Current, ON
Input Voltage, OFF
Supply Voltage*
Operating Temperature
Fan-out (TTL Load)
SYMBOL MIN TYP. MAX UNIT
IF(ON)
2
―
10
mA
VF(OFF)
0
―
0.8
V
VCC
4.5
―
20
V
Topr
-40
―
100
°C
N
―
―
4
―
TLP105
* This item denotes operating range, not meaning of recommended operating conditions.
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this product,
please confirm specified characteristics shown in this document.
Absolute Maximum Ratings (Ta = 25°C)
CHARACTERISTIC
SYMBOL RATING
UNIT
Forward Current
Forward Current Derating (Ta ≥ 83°C)
Peak Transient Forward Current
Reverse Voltage
Input Power Dissipation
Input Power Dissipation derating (Ta ≥ 83°C)
Output Current 1 (Ta ≤ 25°C)
Output Current 2 (Ta ≤ 100°C)
Output Current Derating (Ta ≥ 25°C)
Peak Output Current
Output Voltage
Output Power Dissipation
Output Power Dissipation Derating (Ta ≥ 25°C)
Supply Voltage
Operating Temperature Range
Storage Temperature Range
Lead Solder Temperature (10 s)
Isolation Voltage (AC, 60 s, R.H. ≤ 60 %)
IF
ΔIF/°C
(Note1)
IFPT
VR
PD
ΔPD/°C
IO1
IO2
ΔIO1/°C
(Note2) IOP
VO
PO
ΔPO /°C
(Note3)
VCC
Topr
Tstg
Tsol
BVs
20
-0.48
1
5
40
-0.95
25/-15
5/-5
-0.26/-0.13
50/-50
-0.5 to 20
75
-0.75
-0.5 to 20
−40 to 100
−55 to 125
260
3750
mA
mA/°C
A
V
mW
mW/°C
mA
mA
mA/°C
mA
V
mW
mW/°C
V
°C
°C
°C
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note 1: Pulse width ≤ 1 μs, 300 pps.
Note 2: Pulse width ≤ 5 μs, duty cycle ≤ 0.025
Note 3: Device considered a two terminal device: pins 1 and 3 shorted together and pins 4, 5 and 6 shorted together.
© 2019
2
Toshiba Electronic Devices & Storage Corporation
2019-05-27
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