ST95022
Table 5. AC Measurement Conditions
Input Rise and Fall Times
≤ 50ns
Input Pulse Voltages
Input and Output Timing
Reference Voltages
0.2VCC to 0.8VCC
0.3VCC to 0.7VCC
Output Load
CL = 100pF
Note that Output Hi-Z is defined as the point where data is no
longer driven.
Figure 12. AC Testing Input Output
Waveforms
0.8VCC
0.2VCC
0.7VCC
0.3VCC
AI00825
Table 6. Input Parameters (1) (TA = 25 °C, f = 2.1 MHz )
Symbol
Parameter
CIN
Input Capacitance (D)
CIN
Input Capacitance (other pins)
tLPF
Input Signal Pulse Width Filtered Out
Note: 1. Sampled only, not 100% tested.
Min
Max
Unit
8
pF
6
pF
10
ns
Table 7. DC Characteristics
(TA = –40 to 125°C; VCC = 4.5V to 5.5V)
Symbol
Parameter
Test Condition
ILI
Input Leakage Current
ILO
Output Leakage Current
ICC
VCC Supply Current (Active)
C = 0.1 VCC/0.9 VCC ,
fC = 2.1 MHz, Q = Open
ICC1
VCC Supply Current (Standby)
S = VCC, VIN = VSS or VCC
VIL
Input Low Voltage
VIH
Input High Voltage
VOL (1)
Output Low Voltage
IOL = 2mA
VOH (1) Output High Voltage
IOH = –2mA
Note: 1. The device meets output requirements for both TTL and CMOS standards.
Min
– 0.3
0.7 VCC
VCC –0.6
Max
2
±2
2
50
0.3 VCC
VCC + 1
0.4
Unit
µA
µA
mA
µA
V
V
V
V
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