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MC33340EVK Просмотр технического описания (PDF) - ON Semiconductor

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MC33340EVK
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MC33340EVK Datasheet PDF : 12 Pages
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MC33340 MC33342
Input Condition
Vsen Input Voltage:
>1.0 V and <2.0 V
>1.0 V and <2.0 V with
two consecutive –V
events detected after 160 s
<1.0 V or >2.0 V
Timer Backup:
Within time limit
Beyond time limit
Temperature Backup:
Within limits
Below lower limit
Above upper limit
Power Supply Voltage:
VCC >3.0 V and <18 V
VCC >0.6 V and <2.8 V
Figure 11. Controller Operating Mode Table
Controller Operation
The divided down battery pack voltage is within the fast charge voltage range. The charger switches from
trickle to fast charge mode as Vsen enters this voltage range, and a reset pulse is then applied to the
timer and the over temperature latch.
The battery pack has reached full charge and the charger switches from fast to a latched trickle mode.
A reset pulse must be applied for the charger to switch back to the fast mode. The reset pulse occurs
when entering the 1.0 V to 2.0 V window for Vsen or when VCC rises above 3.0 V.
The divided down battery pack voltage is outside of the fast charge voltage range. The charger switches
from fast to trickle mode.
The timer has not exceeded the programmed limit. The charger will be in fast charge mode if Vsen and
VCC are within their respective operating limits.
The timer has exceeded the programmed limit. The charger switches from fast to a latched trickle mode.
The battery pack temperature is within the programmed limits. The charger will be in fast charge mode if
Vsen and VCC are within their respective operating limits.
The battery pack temperature is below the programmed lower limit. The charger will stay in trickle mode
until the lower temperature limit is exceeded. When exceeded, the charger will switch from trickle to fast
charge mode.
The battery pack temperature has exceeded the programmed upper limit. The charger switches from fast
to a latched trickle mode. A reset signal must be applied and then released for the charger to switch back
to the fast charge mode. The reset pulse occurs when entering the 1.0 V to 2.0 V window for Vsen or
when VCC rises above 3.0 V.
This is the nominal power supply operating voltage range. The charger will be in fast charge mode if
Vsen, and temperature backup or timer backup are within their respective operating limits.
The undervoltage lockout comparator will be activated and the charger will be in trickle mode. A reset
signal is applied to the timer and over temperature latch.
Testing
Under normal operating conditions, it would take 283
minutes to verify the operation of the 34 stage ripple counter
used in the timer. In order to significantly reduce the test time,
three digital switches were added to the circuitry and are
used to bypass selected divider stages. Entering each of the
test modes without requiring additional package pins or
affecting normal device operation proved to be challenging.
Refer to the timer functional block diagram in Figure 12.
Switch 1 bypasses 19 divider stages to provide a 524,288
times speedup of the clock. This switch is enabled when the
Vsen input falls below 1.0 V. Verification of the programmed
fast charge time limit is accomplished by measuring the
propagation delay from when the Vsen input falls below 1.0 V,
to when the F/T output changes from a high–to–low state.
The 71, 106, 141, 177, 212, 247 and 283 will now correspond
to 8.1, 12.1, 16.2, 20.2, 24.3, 28.3 and 32.3 ms delays. It is
possible to enter this test mode during operation if the
equivalent battery pack voltage was to fall below 1.0 V. This
will not present a problem since the device would normally
switch from fast to trickle mode under these conditions, and
the relatively short variable time delay would be transparent
to the user.
Switch 2 bypasses 11 divider stages to provide a 2048
times speedup of the clock. This switch is necessary for
testing the 19 stages that were bypassed when switch 1 was
enabled. Switch 2 is enabled when the Vsen input falls below
1.0 V and the t1/Tref High input is biased at –100 mV.
Verification of the 19 stages is accomplished by measuring a
nominal propagation delay of 338.8 ms from when the Vsen
input falls below 1.0 V, to when the F/T output changes from
a high–to–low state.
Switch 3 is a dual switch consisting of sections “A” and “B”.
Section “A” bypasses 5 divider stages to provide a 32 times
speedup of the Vsen gate signal that is used in sampling the
battery voltage. This speedup allows faster test verification of
two successive –V events. Section “B” bypasses 11 divider
stages to provide a 2048 speedup of the trickle mode holdoff
timer. Switches 3A and 3B are both activated when the t1/Tref
High input is biased at –100 mV with respect to Pin 4.
8
MOTOROLA ANALOG IC DEVICE DATA

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