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SI5317 Просмотр технического описания (PDF) - Silicon Laboratories

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SI5317 Datasheet PDF : 50 Pages
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Si5317
Table 4. AC Characteristics (Continued)
(VDD = 1.8 ±5%, 2.5 ±10%, or 3.3 V ±10%, TA = –40 to 85 ºC)
Parameter
Symbol
Test Condition
Min
LVCMOS Output Pins
Rise/Fall Times
tRF
CLOAD = 20 pf
See Figure 2
LOSn Trigger Window
Time to Clear LOS Alarm
LOSTRIG From LVST CKINto LOS
Measured from appearance 90
tLOSCLR of valid CKIN to of LOS
alarm
Time to Clear LOL after LOS Cleared tCLRLOL fin unchanged and XA/XB —
stable.
LOS to LOL
PLL Performance
Lock Time
tLOCKHW RST with valid CKIN to 
LOL; BW = 100 Hz
Closed Loop Jitter Peaking
Jitter Tolerance
JPK
JTOL
BW determined by
BWSEL[1:0]
5000/
BW
Minimum Reset Pulse Width
Lock Time
Spurious Noise
tRSTMIN
1
tLOCKMP Reset b to of LOL
SPSPUR
Max spur @ n x f3
(n > 1, n x f3 < 100 MHz)
Typ
25
10
0.05
35
Max Units
ns
750 µs
220 ms
ms
1.2 sec
0.1
1000
–75
dB
ns pk-
pk
µs
ms
dBc
Preliminary Rev. 0.15
11

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