SAA2013H Просмотр технического описания (PDF) - Philips Electronics

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SAA2013H

Adaptive allocation and scaling for PASC coding in DCC systems

Philips Electronics 

Philips Semiconductors

Adaptive allocation and scaling for PASC

coding in DCC systems

PINNING

SYMBOL

TEST10

TEST11

L3MODEM

L3CLKM

L3DATAM

VSS1

TEST12

TEST13

L3MODEC

L3CLKC

L3DATAC

TEST1

TEST2

VDD1

TEST3

TEST4

TEST5

TEST6

TEST7

NODONE

RESOL0

RESOL1

RESET

VDD2

VSS2

CLK24

LOWPWR

POR

TEST8

SLEEP

FDWS

FDCL

FDAO

FDAI

FSYNC

FRESET

FDIR

TEST9

FS256

VDD3

May 1994

PIN

DESCRIPTION

1

test input; connect to VSS

2

test input; connect to VSS

3 microcontroller interface mode input

4 microcontroller interface clock input

5 microcontroller interface data 3-state input/output

6 supply ground

7 test output; do not connect

8 test output; do not connect

9 codec interface mode output

10 codec interface clock output

11 codec interface data 3-state input/output

12 test output; do not connect

13 test output; do not connect

14 supply voltage

15 test mode input; connect to VDD

16 test mode input; connect to VDD

17 test input; connect to VSS

18 test input; connect to VSS

19 test input; connect to VSS

20 nodone state selection input; connect to VDD

21 resolution selection 0 input

22 resolution selection 1 input

23 reset input; active HIGH

24 supply voltage

25 supply ground

26 24.576 MHz clock input

27 low power decode select input

28 power on reset input

29 test input; connect to VSS

30 sleep mode select input

31 filtered data word select

32 filtered data clock

33 filtered data output

34 filtered data input

35 sub-band synchronization on filtered I2S bus

36 reset signal input from SAA2003

37 filtered data direction input

38 test input; connect to VSS

39 system clock input; 256 × sample frequency (fs)

40 supply voltage

4

Preliminary specification

SAA2013

TYPE

I

I

I

I

I/O

−

O

O

O

O

I/O

O

O

−

I

I

I

I

I

I

I

I

I

−

−

I

I

I

I

I

I

I

O

I

I

I

I

I

I

−

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