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RE46C166

CMOS Photoelectric Smoke Detector ASIC with Interconnect, Timer Mode and Alarm Memory

Microchip Technology 

RE46C165/6/7/8

1.0 ELECTRICAL

CHARACTERISTICS

Absolute Maximum Ratings†

VDD ........................................................................... 12.5V

Input Voltage Range Except FEED, I/O .. VIN = -.3V to VDD +.3V

FEED Input Voltage Range ............... VINFD =-10 to +22V

I/O Input Voltage Range .......................... VIO1= -.3 to 15V

Input Current except FEED, TEST, VSEN ...... IIN = 10 mA

Input Current for FEED, VSEN....................... IIN = 500 µA

Operating Temperature ..........................TA = -25 to +75°C

Storage Temperature.......................TSTG = -55 to +125°C

Maximum Junction Temperature ................... TJ = +150°C

† Notice: Stresses above those listed under “Maximum

ratings” may cause permanent damage to the device. This

is a stress rating only and functional operation of the

device at these or any other conditions above those indi-

cated in the operation listings of this specification is not

implied. Exposure to maximum rating conditions for

extended periods may affect device reliability.

DC ELECTRICAL CHARACTERISTICS

DC Electrical Characteristics: Unless otherwise indicated, all parameters apply at TA = -25° to +75°, VDD = 9V,

Typical Application (unless otherwise noted), VSS = 0V

Parameter

Symbol

Test

Pin

Min

Typ

Max Units

Conditions

Supply Voltage

Supply Current

VDD

5

6

—

12

V Operating

IDD1

5

—

4

6

µA COSC = VSS, LED off

IDD2

5

—

5.5

8

µA COSC = VSS, LED off,

VDD = 12V

IDD3

5

—

—

2

mA COSC = VSS,

STROBE on IRED off

IDD4

5

—

—

Input Voltage High

VIH1

10

6.2

4.5

VIH2

7

3.2

—

3

mA COSC = VSS,

STROBE on, IRED on,

Note 1

—

V FEED

—

V No local alarm,

I/O as an input

VIH3

15

1.6

—

—

V VSEN

VIH4

16

8.5

—

—

V TEST

Input Voltage Low

VIL1

10

—

4.5

2.7

V FEED

VIL2

7

—

—

1.5

V No local alarm,

I/O as an input

Input Leakage Low

VIL3

15

—

VIL4

16

—

IIL1

1, 2, 3

—

—

0.5

V VSEN

—

7

V TEST

—

-100

nA VDD = 12V, COSC = 12V,

STROBE active

Note 1:

2:

3:

IIL2

12, 10

—

—

-100

IIL3

15, 16

—

—

-1

ILFD

10

—

—

-50

Does not include Q3 emitter current.

Not production tested.

Production test at room temperature with guard banded limits.

nA VDD = 12V, VIN = VSS

µA VDD = 12V, VIN = VSS

µA FEED = -10V

 2010 Microchip Technology Inc.

DS22251A-page 5

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