HCF4014B Просмотр технического описания (PDF) - STMicroelectronics
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HCF4014B Datasheet PDF : 13 Pages
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HCC/HCF4014B/4021B
DYNAMIC ELECTRICAL CHARACTERISTICS (Continued)
Symbol
Parameter
Test Conditions
Value
Unit
VDD (V) Min. Typ. Max.
CLOCKED OPERATION
tr, tf Clock Input Rise or Fall Time
5
15
10
15
µs
15
15
tsetup Setup Time, serial Input (ref. to CL)
5
120 60
10
80
40
ns
15
60
30
tsetup
Setup Time, parallel Input (4014B)
(ref. to CL)
5
80 40
10
50
25
ns
15
40
20
tsetup
Setup Time, parallel Input (4021B)
(ref. to P/S)
5
50 25
10
30
15
ns
15
20
10
tsetup
Setup Time, parallel/serial Control (4014B)
(ref. to CL)
5
180 90
10
80
40
ns
15
60
30
thold Hold Time, serial in, parallel in,
parallel/serial Cotrol
5
0
10
0
ns
15
0
tWH P/S Pulse Width (4021B)
5
160 80
10
80
40
ns
15
50
25
trem P/S Removal time (4021B)
(ref. to CL)
5
280 140
10 140 70
ns
15 100 50
* If more than one unit is cascaded trCL should be made less than or equal to the sum of the transition time and the fixed propagation delay of
the output of the driving stage of the estimated capacitive load.
Typical Output Low (sink) Current Characteristics.
Minimum Output Low (sink) Current Charac-
teristics.
6/13
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