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AT49BV008A Просмотр технического описания (PDF) - Atmel Corporation

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AT49BV008A Datasheet PDF : 16 Pages
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AT49BV008A(T)/8192A(T)
Command Definition (in Hex) for Alternate Pin Definition of AT49BV008A(T)(1)
Command
Sequence
Bus
Cycles
1st Bus
Cycle
Addr Data
2nd Bus
Cycle
Addr Data
3rd Bus
Cycle
Addr Data
4th Bus
Cycle
Addr Data
5th Bus
Cycle
Addr Data
6th Bus
Cycle
Addr Data
Read
Chip Erase
Sector Erase
1
Addr DOUT
6
A555 AA 5AAA 55 A555 80 2555 AA 5AAA 55 A555 10
6
A555 AA 5AAA 55 A555 80 2555 AA 5AAA 55 SA(4) 30
Byte/Word Program
4
A555 AA 5AAA 55 A555 A0 Addr DIN
Boot Block Lockout(2)
6
A555 AA 5AAA 55 A555 80 2555 AA 5AAA 55 A555 40
Product ID Entry
3
A555 AA 5AAA 55 A555 90
Product ID Exit(3)
3
A555 AA 5AAA 55 A555 F0
Product ID Exit(3)
1
xxxx F0
Notes:
1. The DATA FORMAT in each bus cycle is as follows: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex)
The ADDRESS FORMAT in each bus cycle is as follows: A15 - A0 (Hex), A-1, and A15 - A18 (Don’t Care)
2. The boot sector has the address range 00000H to 03FFFH for the AT49BV008A; FC000H to FFFFFH for the
AT49BV008AT; 00000H to 01FFFH for the AT49BV8192A; and 7E000H to 7FFFFH for the AT49BV8192AT.
3. Either one of the Product ID Exit commands can be used.
4. SA = sector addresses: (A0 - A18)
For the AT49BV008A/8192A
SA = 02XXX for BOOT BLOCK
SA = 04XXX for PARAMETER BLOCK 1
SA = 06XXX for PARAMETER BLOCK 2
SA = FEXXX for MAIN MEMORY ARRAY
For the AT49BV008AT/8192AT
SA = FEXXX for BOOT BLOCK
SA = FAXXX for PARAMETER BLOCK 1
SA = 78XXX for PARAMETER BLOCK 2
SA = 76XXX for MAIN MEMORY ARRAY
Absolute Maximum Ratings*
Temperature Under Bias ................................ -55°C to +125°C
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to VCC + 0.6V
Voltage on RESET
with Respect to Ground ...................................-0.6V to +13.5V
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
7

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