OP77(RevC) Просмотр технического описания (PDF) - Analog Devices

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производитель

OP77
(Rev.:RevC)

Next Generation OP07 Ultralow Offset Voltage Operational Amplifier

Analog Devices 

OP77

200k⍀

50⍀

OP77

VO

VOS

=

VO

4000

Figure 1. Typical Offset Voltage Test Circuit

2.5M⍀

100⍀

100⍀

V+

2

7

3 OP77

6 3.3k⍀

4

V–

OUTPUT

4.7␮F

( 10Hz FILTER)

INPUT

REFERRED

NOISE

=

VO

25,000

Figure 2. Typical Low-Frequency Noise Test Circuit

–

INPUT +

20k⍀

2 18

3 OP77 7 6

4

V–

V+

OUTPUT

Figure 3. Optional Offset Nulling Circuit

100k⍀

+18V

+

* 10␮F 10⍀

2

7

3 OP77 6

10k⍀ 10k⍀

4

0.1␮F

10␮F * +

10⍀ 0.1␮F

–18V

*1 PER BOARD

Figure 4. Burn-In Circuit

10k⍀

100k⍀

1M⍀

VIN = 10V

10⍀

VX

RL

TYPICAL

PRECISION OP AMP

VY

–10V 0V

VX

+10V

AVO ~ 650V/mV

NOTES

RL = 2k⍀

1. GAIN NOT CONSTANT. CAUSES NONLINEAR ERRORS.

2. AVO SPEC IS ONLY PART OF THE SOLUTION.

3. CHECK THE OP AMP PERFORMANCE, ESPECIALLY AT TEMPERATURES.

Figure 5. Open-Loop Gain Linearity

Actual open-loop voltage gain can vary greatly at various output

voltages. All automated testers use endpoint testing and therefore

only show the average gain. This causes errors in high closed-

loop gain circuits. Since this is so difficult for manufacturers to

test, users should make their own evaluation. This simple test

circuit makes it easy. An ideal op amp would show a horizontal

scope trace.

VY

–10V

0V

+10V

VX

AVO ~ 650V/mV

RL = 2k⍀

Figure 6. Output Gain Linearity Trace

This is the output gain linearity trace for the new OP77. The

output trace is virtually horizontal at all points, assuring extremely

high gain accuracy. The average open-loop gain is truly impres-

sive—approximately 10,000,000.

–10–

REV. C

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