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SPT7868SIR Просмотр технического описания (PDF) - Signal Processing Technologies

Номер в каталоге
Компоненты Описание
производитель
SPT7868SIR
SPT
Signal Processing Technologies SPT
SPT7868SIR Datasheet PDF : 5 Pages
1 2 3 4 5
ELECTRICAL SPECIFICATIONS
TA=TMIN to TMAX, VDD=+5.0 V, ƒS=80 MSPS, VRHS=3.0 V, VRLS=2.0 V, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
TEST
LEVEL
MIN
Power Supply Requirements
VDD Voltage (Analog Supply)
OVDD Voltage (Output Supply)
VDD Current
OVDD Current
Power Dissipation
External Voltage Reference
Internal Voltage Reference
Sleep Mode Power Dissipation
External Voltage Reference
Internal Voltage Reference
Power Supply Rejection Ratio (PSRR)
IV
4.75
IV
2.7
VI
VI
VI
VI
VI
VI
V
SPT7868
TYP
5.0
3.3/5.0
125
14
619
627
TBD
TBD
TBD
Internal References
Common Mode Voltage Reference (VCM) IO = –1 µA
Common Mode Voltage Tempco
Output Impedance
Current Capability
Reference Low Output Voltage (VREFL) (EXT/INT) = 0
Reference High Output Voltage (VREFH) (EXT/INT) = 0
External References
Reference Low Input Voltage Range
Reference High Input Voltage Range
(EXT/INT) = 1
(EXT/INT) = 1
Digital Outputs
Output Voltage High
Output Voltage Low
IO = –2 mA
IO = 2 mA
VI
TBD
2.5
V
100
V
TBD
VI
TBD
VI
1.95
2.0
VI
2.95
3.0
IV
1.7
2.0
IV
2.7
3.0
VI
85% OVDD 90% OVDD
VI
0.2
Digital Inputs
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
VI
80% VDD
VI
VI
VI
Clock Inputs
Clock Inputs High Voltage
Clock Inputs Low Voltage
VI
2
VI
MAX UNITS
5.25
5.25
131
16
643
651
TBD
TBD
V
V
mA
mA
mW
mW
mW
mW
mV/V
TBD
2.05
3.05
V
ppm/°C
k
µA
V
V
2.3
V
3.3
V
OVDD V
0.4
V
V
20% VDD V
±10 µA
±10 µA
5
V
0.4
V
TEST LEVEL CODES
TEST LEVEL
All electrical characteristics are subject to the
I
following conditions:
II
All parameters having min/max specifications are
guaranteed. The Test Level column indicates the
III
specific device testing actually performed during
production and Quality Assurance inspection. Any
IV
blank section in the data column indicates that the
specification is not tested at the specified
V
condition.
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested
at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
SPT
3
SPT7868
8/15/00

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