NB6L11M
Table 2. ATTRIBUTES
Characteristics
ESD Protection
Human Body Model
Machine Model
Moisture Sensitivity
16−QFN
Flammability Rating
Oxygen Index: 28 to 34
Transistor Count
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
For additional information, see Application Note AND8003/D.
Value
> 2 kV
> 200V
Level 1
UL 94 V−0 @ 0.125 in
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
VEE
VIO
VINPP
IIN
Positive Power Supply
Negative Power Supply
Positive Input/Output Voltage
Negative Input/Output Voltage
Differential Input Voltage |D − D|
Input Current Through RT (50 W Resistor)
VEE = 0 V
VCC = 0 V
VEE = 0 V
VCC = 0 V
Static
Surge
4.0
V
−4.0
V
−0.5 v VIo v VCC + 0.5
4.0
V
+0.5 v VIo v VEE − 0.5
−4.0
V
VCC − VEE
V
45
mA
80
mA
IOUT
Output Current (CML Output)
Continuous
Surge
25
mA
50
mA
IVREFAC
TA
Tstg
qJA
VREFAC Sink/Source Current
Operating Temperature Range
Storage Temperature Range
Thermal Resistance (Junction−to−Ambient)
(Note 3)
16 QFN
0 lfmp
500 lfmp
QFN−16
QFN−16
$0.5
−40 to +85
−65 to +150
42
35
mA
_C
_C
_C/W
_C/W
qJC
Thermal Resistance (Junction−to−Case)
(Note 3)
QFN−16
4
_C/W
Tsol
Wave Solder Pb−Free
265
_C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
3. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad.
http://onsemi.com
3