SPT7871SIQ Просмотр технического описания (PDF) - Signal Processing Technologies
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SPT7871SIQ Datasheet PDF : 8 Pages
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ELECTRICAL SPECIFICATIONS
TA = +25 °C , DVCC =AVCC = +5.0 V, VEE = -5.2 V, VIN = ±1.0 V, fclock = 80 MHz, 50% clock duty cycle, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
TEST
LEVEL
MIN
TYP
MAX
Dynamic Performance
Signal-to-Noise + Distortion (SINAD)
fIN =10 MHz
fIN = 25 MHz
fIN = 25 MHz
fclock = 100 MHz
fIN = 50 MHz
fIN = 50 MHz
fclock = 100 MHz
Spurious Free Dynamic Range
fIN = 10 MHz
fIN = 25 MHz
fIN = 50 MHz
Two-Tone IMD Rejection2
Differential Phase
Differential Gain
I
51
53
I
51
53
V
50
I
47
49
V
47
V
65
V
63
V
52
V
-65
V
0.5
V
1
Power Supply Requirements
AVCC Supply Voltage
DVCC Supply Voltage
VEE Supply Voltage
VCC Supply Current
VEE Supply Current
Power Dissipation
Power Supply Rejection Ratio
Full Temperature
Full Temperature
Full Temperature
IV
4.75
IV
4.75
IV
-4.95
VI
VI
VI
IV
5.0
5.25
5.0
5.25
-5.2
-5.45
210
248
128
151
1.7
2.0
30
Digital Inputs
LINV, MINV
V
CMOS/TTL
Clock Inputs
Logic 1 Voltage (ECL)
Logic 0 Voltage (ECL)
Maximum Input Current Low
Maximum Input Current High
Pulse Width Low (CLK)
Pulse Width High (CLK)
Rise/Fall Time
20% to 80%
VI
-1.1
VI
VI
-100
VI
-100
IV
4.0
IV
4.0
IV
-1.5
+100
+100
250
250
1.5
Digital Outputs
Logic 1 Voltage (TTL)
2 mA
VI
2.4
2.8
Logic 0 Voltage (TTL)
2 mA
VI
0.5
0.8
tRise
tFall
10% to 90%
V
2.0
10% to 90%
V
2.0
12048 pt FFT using distortion harmonics 2 through 10.
2Measured as a second order (f1-f2) intermodulation product from a two-tone test with each input tone at 0 dBm.
UNITS
dB
dB
dB
dB
dB
dB FS
dB FS
dB FS
dBc
Degree
%
V
V
V
mA
mA
W
dB
Logic
V
V
µA
µA
ns
ns
ns
V
V
ns
ns
TEST LEVEL CODES
TEST LEVEL
All electrical characteristics are subject to the
I
following conditions:
II
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
III
cates the specific device testing actually per-
IV
formed during production and Quality Assur-
ance inspection. Any blank section in the data
V
column indicates that the specification is not
tested at the specified condition.
VI
Unless otherwise noted, all tests are pulsed
tests; therefore, TJ = TC = TA.
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
SPT
3
SPT7871
9/7/98
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