MX25L1602MC Просмотр технического описания (PDF) - Macronix International
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MX25L1602MC Datasheet PDF : 24 Pages
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MX25L1602
GENERAL DESCRIPTION
The MX25L1602 is a CMOS 16,777,216 bit serial Flash
EEPROM, which is configured as 2,097,152 x 8 internally.
The MX25L1602 features a serial peripheral interface and
software protocol allowing operation on a simple 3- wire
bus. The three bus signals are a clock input (SCLK), a
serial data input (SI), and a serial data output (SO). SPI
access to the device is enabled by CS input.
The MX25L1602 provide sequential read operation on
whole chip. The sequential read operation is executed on
a segment (512 byte) basis. User may start to read from
any byte of the segment. While the end of the segment is
reached, the device will wrap around to the beginning of the
segment and continuously outputs data until CS goes high.
After program/erase command is issued, auto program/
erase algorithms which program/erase and verify the
specified page locations will be executed. Program
command is executed on a page (128 bytes) basis, and
erase command is executed on both chip and sector (8K
bytes) basis.
To provide user with ease of interface, a status register is
included to indicate the status of the chip. The status read
command can be issued to detect completion and error
flag status of a program or erase operation.
When the device is not in operation and CS is high, it is put
in standby mode and draws less than 30uA DC current.
The MX25L1602 utilizes MXIC's proprietary memory cell
which reliably stores memory contents even after 100,000
program and erase cycles.
PIN CONFIGURATIONS
28-PIN SOP (330 mil)
NC 1
TEST 2
DU 3
NC 4
NC 5
NC 6
NC 7
NC 8
NC 9
NC 10
NC 11
NC 12
NC 13
NC 14
28 NC
27 GND
26 VCC
25 NC
24 NC
23 NC
22 SI
21 SO
20 CS
19 SCLK
18 NC
17 NC
16 NC
15 NC
P/N: PM0819
PIN DESCRIPTION
SYMBOL
CS
TEST(1)
SI
SO
SCLK
VCC
GND
DU(2)
NC
DESCRIPTION
Chip Select
Test Mode Select
Serial Data Input
Serial Data Output
Clock Input
+ 3.3V Power Supply
Ground
Do Not Use(for Test Mode only)
No Internal Connection
Note:
1.TEST input is used for in-house testing and must be tied
to ground during normal user operation.
2.DU pin is used for in-house testing and can be tied to
VCC, GND or open for normal operation.
REV. 1.0, MAR. 04, 2003
2
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