MFRC523 Просмотр технического описания (PDF) - NXP Semiconductors.

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MFRC523

Contactless Reader IC

NXP Semiconductors. 

NXP Semiconductors

MFRC523

Contactless reader IC

Table 157. Test bus signals: TestBusSel[4:0] = 0Dh

Pins

Internal test Description

signal name

D6

clkstable

oscillator output signal

D5

clk27/8

oscillator output signal divided by 8

D4 to D3 -

reserved

D2

clk27

oscillator output signal

D1

-

reserved

16.1.3 Test signals on pins AUX1 or AUX2

The MFRC523 allows the user to select internal signals for measurement on pins AUX1 or

AUX2. These measurements can be helpful during the design-in phase to optimize the

design or used for test purposes.

Table 158 shows the signals that can be switched to pin AUX1 or AUX2 by setting

AnalogSelAux1[3:0] or AnalogSelAux2[3:0] in the AnalogTestReg register.

Remark: The DAC has a current output, therefore it is recommended that a 1 kΩ

pull-down resistor is connected to pin AUX1 or AUX2.

Table 158. Test signal descriptions

AnalogSelAux1[3:0]

or

AnalogSelAux2[3:0]

value

Signal on pin AUX1 or pin AUX2

0000

3-state

0001

DAC: register TestDAC1 or TestDAC2

0010

DAC: test signal Corr1

0011

reserved

0100

DAC: test signal MinLevel

0101

DAC: test signal ADC_I

0110

DAC: test signal ADC_Q

0111 to 1001

reserved

1010

HIGH

1011

LOW

1100

TxActive

1101

RxActive

1110

subcarrier detected

1111

TstBusBit

16.1.3.1 Example: Output test signals TestDAC1 and TestDAC2

The AnalogTestReg register is set to 11h. The output on pin AUX1 has the test signal

TestDAC1 and the output on pin AUX2 has the test signal TestDAC2. The signal values of

TestDAC1 and TestDAC2 are controlled by the TestDAC1Reg and TestDAC2Reg

registers.

MFRC523_33

Product data sheet

PUBLIC

All information provided in this document is subject to legal disclaimers.

Rev. 3.3 — 5 March 2010

115233

© NXP B.V. 2010. All rights reserved.

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