33981(2008) Просмотр технического описания (PDF) - Freescale Semiconductor
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33981 Datasheet PDF : 37 Pages
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ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 3. Static Electrical Characteristics (continued)
Characteristics noted under conditions 6.0 V ≤ VPWR ≤ 27 V, -40°C ≤ TA ≤ 125°C, unless otherwise noted. Typical values
noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
POWER OUTPUT (VPWR) (continued)
Current Sense Leakage(9)
I NHS = 1 with OUT opened of load or INHS = 0
ILEAK(CSNS)
0
μA
13
17
Over-temperature Shutdown
Over-temperature Shutdown Hysteresis(10)
LOW SIDE GATE DRIVER (VPWR, VGLS, VOCLS)
Low Side Gate Voltage
VPWR = 6.0 V
VPWR = 9.0 V
VPWR = 13 V
VPWR = 27 V
Low Side Gate Sinked Current
VGLS = 2.0 V, VPWR = 13 V
Low Side Gate Sourced Current
VGLS = 2.0 V, VPWR = 13 V
Low Side Overload Detection Level versus Low Side Drain Voltage
VOCLS - VDLS, (VOCLS ≤ 4.0 V)
TSD
160
175
190
°C
TSDHYS
5.0
–
20
°C
VGLS
V
5.0
5.4
6.0
8.0
8.4
9.0
12.0
12.4
13.0
12.0
12.4
13.0
I GLSNEG
mA
–
100
–
I GLSPOS
mA
–
100
–
VDS_LS
mV
-50
–
+50
CONTROL INTERFACE (CONF, INHS, INLS, EN, OCLS)
Input Logic High-voltage (CONF, INHS, INLS)
VIH
3.3
–
–
V
Input Logic Low-voltage (CONF, INHS, INLS)
VIL
–
–
1.0
V
Input Logic Voltage Hysteresis (CONF, INHS, INLS)
VINHYS
100
600
1200
mV
Input Logic Active Pull-down Current (INHS, INLS)
IDWN
5.0
10
20
μA
Enable Pull-down Resistor (EN)
RDWN
100
200
400
kΩ
Enable Voltage Threshold (EN)
VEN
2.5
V
Input Clamp Voltage (EN)
IEN < 2.5 mA
VCLEN
V
7.0
–
14
Input Forward Voltage (EN)
VF(EN)
-2.0
–
-0.3
V
Input Active Pull-up Current (OCLS)
IOCLS p
50
100
200
μA
Input Active Pull-up Current (CONF)
FS Tri-state Capacitance(10)
I CONF
5.0
10
20
μA
CFS
–
–
20
pF
FS Low-state Output Voltage
IFS = -1.6 mA
VFSL
V
–
0.2
0.4
Temperature Feedback
TA = 25°C for VPWR = 14 V
VTFEED
V
3.35
3.45
3.55
Temperature Feedback Derating(10)
DTFEED
-8.5
-8.9
-9.3
mV/°C
Notes
9. This parameter is achieved by the design characterization by measuring a statistically relevant sample size across process variations
but not tested in production.
10. Parameter is guaranteed by process monitoring but is not production tested.
33981
6
Analog Integrated Circuit Device Data
Freescale Semiconductor
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