MC100E431(2016) Просмотр технического описания (PDF) - ON Semiconductor
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MC100E431 Datasheet PDF : 9 Pages
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MC10E431, MC100E431
Table 8. AC CHARACTERISTICS (VCCx= 5.0 V; VEE= 0.0 V or VCCx= 0.0 V; VEE= −5.0 V (Note 1))
−40°C
25°C
85°C
Symbol
Characteristic
fMAX Maximum Toggle Frequency
tPLH Propagation Delay to Output
tPHL
CLK
R
S
Min Typ Max Min Typ Max Min Typ Max Unit
1.1
GHz
ps
550 700 850 550 700 850 550 700 850
500 725 975 550 725 925 550 725 925
500 725 975 550 725 925 550 725 925
tS
Setup Time
D
R (Note 2)
S (Note 2)
ps
250
0
200
0
200
0
1100 700
1000 700
1000 700
1100 700
1000 700
1000 700
tH
tPW
tskew
tJITTER
VPP
Hold Time
Minimum Pulse Width
Within-Device Skew (Note 3)
Random Clock Jitter (RMS)
Input Voltage Swing
(Differential Configuration)
D 250
CLK 400
150
0
200
400
50
<1
1000 150
0
200
400
<1
1000 150
0
ps
ps
50
ps
<1
ps
1000 mV
tr/tf Rise/Fall Times (20−80%)
250 450 700
275 450 650 ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification
limit values are applied individually under normal operating conditions and not valid simultaneously.
1. 10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
2. These setup times define the minimum time the CLK or SET/RESET input must wait after the assertion of the RESET/SET input to assure
the proper operation of the flip-flop.
3. Within-device skew is defined as identical transitions on similar paths through a device.
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