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L6924D Просмотр технического описания (PDF) - STMicroelectronics

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L6924D
3 Maximum ratings
Maximum ratings
Stressing the device above the rating listed in the “Absolute Maximum Ratings” table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the Operating sections of this
specification is not implied. Exposure to Absolute Maximum Rating conditions for extended
periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and
other relevant quality documents.
3.1
Absolute maximum ratings
Table 3. Absolute maximum ratings
Symbol
Parameter
VIN
Input voltage
VINSNS, SD
Input voltage
VOUT, VOSNS
Output voltage
ST1, ST2
Output voltage
Output current
VREF, TH, IEND, IPRG,
VPRE, IPRE, VOPRG,
TPRG, GND
ST1 and TH pins
Other pins
Maximum Withstanding Voltage Range Test Condition:
CDFAEC-Q100-002 (Normal “Human Body Model”
Acceptance Criteria Performance)
Value
–0.3 to 16
–0.3 to VIN
–0.3 to 5
–0.3 to 6
30
–0.3 to 4
±1.5
±2
Unit
V
V
V
V
mA
V
kV
kV
3.2
Thermal data
Table 4. Thermal data
Symbol
Parameter
RthJA
Thermal resistance junction to ambient (1)
TSTG
Storage temperature range
TJ
Junction temperature range
PTOT
Power dissipation at T= 70°C
1. Device mounted on Demo board
Value
75
–55 to 150
–40 to 125
TBD
Unit
°C/W
°C
°C
W
7/38

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