L12URF9553-4S Просмотр технического описания (PDF) - LIGITEK electronics co., ltd.
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L12URF9553-4S Datasheet PDF : 8 Pages
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PART NO. L12URF9553-4S/TR1
Reliability Test:
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Page 7/7
Classification
Endurance
Test
Environmental
Test
Test Item
Operating Life Test
High Temperature
Storage Test
Test Condition
1.Ta=Under Room Temperature As Per Data Sheet
Maximum Rating.
2.If=50mA
3.t=1000 hrs (-24hrs, +72hrs)
1.Ta=1 00℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Reference
Standard
MIL-STD-750D: 1026
MIL-STD-883D: 1005
JIS C 7021: B-1
MIL-STD-883D:1008
JIS C 7021: B-10
Low Temperature
Storage Test
1.Ta=-40 ℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
High Temperature
High Humidity
Storage Test
Thermal Shock Test
Solderability Test
Temperature
Cycling
1.Ta=65 ℃±5℃
2.RH=90 %~95 %
3.t=240hrs ±2hrs
1.Ta=105 ℃±5℃&-40℃±5℃
(30min)
(30min)
2.total 100 cycles
1.T.Sol=235 ℃±5℃
2.Immersion time 2 ±0.5sec
3.Coverage ≧95% of the dipped surface
1.105℃ ~ 25℃ ~ -55℃ ~ 25℃
30mins 5mins 30mins 5mins
2.10 Cyeles
IR Reflow
Ramp-up rate(217℃ to Peak) +3℃ second max
Temp. maintain at 175( ±25)℃ 180 seconds max
Temp. maintain above 217℃ 60-150 seconds
Peak temperature range 260℃+5/-0℃
Time within 5℃ of actual Peak Temperature(tp)
10-30 seconds
Ramp-down rate +6 ℃/second max
JIS C 7021: B-12
MIL-STD-202F:103B
JIS C 7021: B-11
MIL-STD-202F: 107D
MIL-STD-750D: 1051
MIL-STD-883D: 1011
MIL-STD-202F: 208D
MIL-STD-750D: 2026
MIL-STD-883D: 2003
IEC 68 Part 2-20
JIS C 7021: A-2
MIL-STD-202F: 107D
MIL-STD-750D: 1051
MIL-STD-883D: 1010
JIS C 7021: A-4
MIL-STD-750D:2031.2
J-STD-020B
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