K6X1008C2D-F Просмотр технического описания (PDF) - Samsung
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K6X1008C2D-F Datasheet PDF : 10 Pages
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K6X1008C2D Family
CMOS SRAM
PRODUCT LIST
Commercial Products(0~70°C)
Part Name
Function
K6X1008C2D-DB55
K6X1008C2D-DB70
K6X1008C2D-GB55
K6X1008C2D-GB70
K6X1008C2D-BB551)
K6X1008C2D-BB701)
K6X1008C2D-TB55
K6X1008C2D-TB70
K6X1008C2D-PB551)
K6X1008C2D-PB701)
32-DIP, 55ns, LL
32-DIP, 70ns, LL
32-SOP, 55ns, LL
32-SOP, 70ns, LL
32-SOP, 55ns, LL
32-SOP, 70ns, LL
32-TSOP-F, 55ns, LL
32-TSOP-F, 70ns, LL
32-TSOP-F, 55ns, LL
32-TSOP-F, 70ns, LL
1. Lead Free Product
Industrial Products(-40~85°C)
Part Name
Function
K6X1008C2D-DF55
K6X1008C2D-DF70
K6X1008C2D-GF55
K6X1008C2D-GF70
K6X1008C2D-BF551)
K6X1008C2D-BF701)
K6X1008C2D-TF55
K6X1008C2D-TF70
K6X1008C2D-PF551)
K6X1008C2D-PF701)
32-DIP, 55ns, LL
32-DIP, 70ns, LL
32-SOP, 55ns, LL
32-SOP, 70ns, LL
32-SOP, 55ns, LL
32-SOP, 70ns, LL
32-TSOP-F, 55ns, LL
32-TSOP-F, 70ns, LL
32-TSOP-F, 55ns, LL
32-TSOP-F, 70ns, LL
Automotive Products(-40~125°C)
Part Name
Function
K6X1008C2D-GQ55
K6X1008C2D-GQ70
K6X1008C2D-TQ55
K6X1008C2D-TQ70
32-SOP, 55ns, L
32-SOP, 70ns, L
32-TSOP-F, 55ns, L
32-TSOP-F, 70ns, L
FUNCTIONAL DESCRIPTION
CS1
CS2
OE
WE
H
X1)
X1)
X1)
X1)
L
X1)
X1)
L
H
H
H
L
H
L
H
L
H
X1)
L
1. X means don′t care (Must be in high or low states)
I/O
High-Z
High-Z
High-Z
Dout
Din
Mode
Deselected
Deselected
Output Disabled
Read
Write
Power
Standby
Standby
Active
Active
Active
ABSOLUTE MAXIMUM RATINGS1)
Item
Symbol
Ratings
Unit
Remark
Voltage on any pin relative to Vss
VIN,VOUT
-0.5 to VCC+0.5V(Max. 7.0V)
V
-
Voltage on Vcc supply relative to Vss
VCC
-0.3 to 7.0
V
-
Power Dissipation
PD
1.0
W
-
Storage temperature
TSTG
-65 to 150
°C
-
Operating Temperature
0 to 70
°C
K6X1008C2D-B
TA
-40 to 85
°C
K6X1008C2D-F
-40 to 125
°C
K6X1008C2D-Q
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
3
Revision 1.0
September 2003
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