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K03H1202 Просмотр технического описания (PDF) - Infineon Technologies

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K03H1202 Datasheet PDF : 14 Pages
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IKA03N120H2
180ns
160ns
140ns
120ns
100ns
80ns
60ns
40ns
0Ohm
T =150°C
J
T =25°C
J
100Ohm
200Ohm
300Ohm
RG, GATE RESISTANCE
Figure 23. Typical reverse recovery time
as a function of diode current slope
VR=800V, IF=3A,
Dynamic test circuit in Figure E)
0.6uC
0.5uC
T =150°C
J
0.4uC
0.3uC
0.2uC
0Ohm
T =25°C
J
100Ohm
200Ohm
300Ohm
RG, GATE RESISTANCE
Figure 24. Typical reverse recovery
charge as a function of diode current
slope
(VR=800V, IF=3A,
Dynamic test circuit in Figure E)
16A
14A
12A
T =150°C
J
10A
T =25°C
J
8A
0Ohm
100Ohm
200Ohm
300Ohm
RG, GATE RESISTANCE
Figure 25. Typical reverse recovery
current as a function of diode current
slope
(VR=800V, IF=3A,
Dynamic test circuit in Figure E)
-600A/us
-800A/us
-1000A/us
-1200A/us
-1400A/us
-1600A/us
-1800A/us
0Ohm
T =150°C
J
T =25°C
J
100Ohm
200Ohm
300Ohm
RG, GATE RESISTANCE
Figure 26. Typical diode peak rate of fall
of reverse recovery current as a
function of diode current slope
(VR=800V, IF=3A,
Dynamic test circuit in Figure E)
Power Semiconductors
10
Mar-04, Rev. 2

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