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IDT72V3672(2003) Просмотр технического описания (PDF) - Integrated Device Technology

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Компоненты Описание
производитель
IDT72V3672
(Rev.:2003)
IDT
Integrated Device Technology IDT
IDT72V3672 Datasheet PDF : 29 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
IDT72V3652/72V3662/72V3672 3.3V CMOS SyncBiFIFOTM
2,048 x 36 x 2, 4,096 x 36 x 2 and 8,192 x 36 x 2
COMMERCIAL TEMPERATURE RANGE
TIMING REQUIREMENTS OVER RECOMMENDED RANGES OF SUPPLY
VOLTAGE AND OPERATING FREE-AIR TEMPERATURE
(For 10ns speed grade only: Vcc = 3.3V ± 0.15V; TA = 0°C to +70°C; JEDEC JESD8-A compliant)
Symbol
Parameter
IDT72V3652L10(1)
IDT72V3662L10(1)
IDT72V3672L10(1)
Min.
Max.
IDT72V3652L15
IDT72V3662L15
IDT72V3672L15
Min.
Max.
Unit
fS
Clock Frequency, CLKA or CLKB
100
66.7
MHz
tCLK
Clock Cycle Time, CLKA or CLKB
10
15
ns
tCLKH
Pulse Duration, CLKA or CLKB HIGH
4.5
6
ns
tCLKL
Pulse Duration, CLKA and CLKB LOW
4.5
6
ns
tDS
Setup Time, A0-A35 before CLKAand B0-B35
before CLKB
tENS1
Setup Time, CSA and W/RA, before
CLKA; CSB, and W/RB before CLKB
3
4
ns
4
4.5
ns
tENS2
tRSTS
Setup Time, ENA and MBA, before
CLKA; ENB, and MBB before CLKB
Setup Time, RST1 or RST2 LOW before CLKA
or CLKB(2)
3
4.5
ns
5
5
ns
tFSS
Setup Time, FS0 and FS1 before RST1 and RST2 HIGH
7.5
7.5
ns
tFWS
Setup Time, FWFT before CLKA
0
0
ns
tDH
Hold Time, A0-A35 after CLKAand B0-B35 after CLKB
0.5
1
ns
tENH
Hold Time, CSA, W/RA, ENA, and MBA after CLKA;
CSB, W/RB, ENB, and MBB after CLKB
0.5
1
ns
tRSTH
Hold Time, RST1 or RST2 LOW after CLKAor CLKB(2)
4
4
ns
tFSH
Hold Time, FS0 and FS1 after RST1 and RST2 HIGH
2
2
ns
tSKEW1(3) Skew Time, between CLKAand CLKBfor EFA/ORA,
EFB/ORB, FFA/IRA, and FFB/IRB
7.5
7.5
ns
tSKEW2(3,4) Skew Time, between CLKAand CLKBfor AEA,
AEB, AFA, and AFB
12
12
ns
NOTES:
1. For 10ns speed grade: Vcc = 3.3V ± 0.15V; TA = 0° to +70°.
2. Requirement to count the clock edge as one of at least four needed to reset a FIFO.
3. Skew time is not a timing constraint for proper device operation and is only included to illustrate the timing relationship between CLKA cycle and CLKB cycle.
4. Design simulated, not tested.
8

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