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HY310 Просмотр технического описания (PDF) - SEOUL SEMICONDUCTOR

Номер в каталоге
Компоненты Описание
производитель
HY310
Seoul
SEOUL SEMICONDUCTOR Seoul
HY310 Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
4. Reliability Tests
Item
Condition
Note Failures
Life Test
Ta = RT, IF = 70mA
1000hrs
0/22
High Temperature Operating
Ta = 100ºC, IF = 20mA
1000hrs
0/22
Low Temperature Operating
Ta = -40ºC, IF = 70mA
1000hrs
0/22
Thermal Shock
Ta = -50ºC (30min) ~ 105º (30min)
(Transfer time : 5sec, 1Cycle = 1hr)
100
cycles
0/40
Resistance to soldering Heat
Ts = 255 ± 5ºC, t = 4 ± 1sec
1 time
0/22
ESD
(Human Body Model)
1kV, 1.5kΩ ; 100pF
1 time
0/22
High Temperature Storage
Ta = 105ºC
1000hrs
0/22
Low Temperature Storage
Temperature Humidity
Storage
Temperature Humidity
Operating
Ta = -50ºC
Ta = 85ºC, RH = 85%
1000hrs
0/22
1000hrs
0/22
Ta = 85ºC, RH = 85%, IF = 40mA
500hrs
0/22
< Judging Criteria For Reliability Tests >
VF
IR
ФV
Notes :
[1] USL : Upper Standard Level
[2] LSL : Lower Standard Level.
USL[1] X 1.2
USL X 2.0
LSL [2] X 0.7
<080612> Rev. 1.7
Rev. 00
December 2007
www.ZLED.com

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