HT48R062 Просмотр технического описания (PDF) - Holtek Semiconductor

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HT48R062

Cost-Effective I/O Type 8-Bit MCU

Holtek Semiconductor 

HT48R062/HT48C062

Pin Assignment

PA3 1

PA2 2

PA1 3

PA0 4

PB0 5

VSS 6

PB1 7

PB2 8

16 P A 4

15 P A 5

14 P A 6

13 P A 7

12 O S C 2

11 O S C 1

10 V D D

9 RES

H T 4 8 R 0 6 2 /H T 4 8 C 0 6 2

1 6 D IP -A /N S O P -A

Pin Description

Pin Name I/O

PA0~PA7

I/O

PB0~PB2

I/O

VDD

¾

VSS

¾

OSC2

O

OSC1

I

RES

I

Code

Option

Pull-high

Wake-up

Pull-high

¾

¾

Crystal

or RC

¾

Description

Bidirectional 8-bit input/output port. A configuration option determines if all of

the pins on this port are configured as wake-up inputs. Software instructions

determine the CMOS output or Schmitt trigger input with a pull-high resistor

(determined by pull-high options).

Bidirectional 3-bit input/output port. Software instructions determine the

CMOS output or Schmitt trigger input with a pull-high resistor (determined by

pull-high options).

Positive power supply

Negative power supply, ground

OSC1, OSC2 are connected to an RC network or a crystal (determined by

code option) for the internal system clock. In the case of RC operation, OSC2

is the output terminal for 1/4 system clock (NMOS open drain output).

Schmitt trigger reset input. Active low.

Note: The Port A wake-up configuration option applies to all pins on Port A. Individual pins on this port cannot be setup

to have a wake-up function.

Absolute Maximum Ratings

Supply Voltage ...........................VSS-0.3V to VSS+6.0V

Input Voltage..............................VSS-0.3V to VDD+0.3V

IOL Total .............................................................150mA

Total Power Dissipation .....................................500mW

Storage Temperature ............................-50°C to 125°C

Operating Temperature...........................-40°C to 85°C

IOH Total ..........................................................-100mA

Note: These are stress ratings only. Stresses exceeding the range specified under ²Absolute Maximum Ratings² may

cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed

in the specification is not implied and prolonged exposure to extreme conditions may affect device reliability.

Rev. 1.21

2

December 30, 2008

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