HCF40105BEY(2002) Просмотр технического описания (PDF) - STMicroelectronics

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Компоненты Описание

производитель

HCF40105BEY
(Rev.:2002)

FIFO REGISTER

STMicroelectronics 

TEST CIRCUIT

HCF40105B

TEST

tPLH, tPHL

tPZL, tPLZ

tPZH, tPHZ

CL = 50pF or equivalent (includes jig and probe capacitance)

RL = 200KΩ

RT = ZOUT of pulse generator (typically 50Ω)

WAVEFORM 1 : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)

SWITCH

Open

VDD

VSS

9/12

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