HBTGFR421-KR Просмотр технического описания (PDF) - SEOUL SEMICONDUCTOR
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производитель
HBTGFR421-KR Datasheet PDF : 13 Pages
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5. Reliability Test
Item
Operating at
Room
temperature
Test Conditions
10mA, @25℃
Duration Number Of
/ Cycle Damaged
500 hrs
0/22
Operating at High
temperature
10mA, @85℃
500 hrs
0/22
Operating at High
temperature
/ High humidity
10mA, @60℃,90%
500 hrs
0/22
Thermal shock
test
-40~85℃ Shift (2hr/cycle)
100 cycle
0/22
Thermal
resistance
Test
85℃, 85% 24hrs Reflow 3 times
(Max 260℃ 10sec) Thermal shock
30 cycle
1 time
0/22
MSL : 2a (30℃, 60% : 4 weeks)
*Criterion
Iv
VF
OK
> Initial value * 0.5
Initial value ± 0.1V
Rev. 02
January 2012
WWW.SEOULSEMICON.COM
서식번호 : SSC-QP-7-07-25 (Rev.0.0)
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