GAL26CV12 Просмотр технического описания (PDF) - Lattice Semiconductor
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GAL26CV12 Datasheet PDF : 17 Pages
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AC Switching Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
PARAM TEST
COND.1
tpd
A
DESCRIPTION
Input or I/O to Comb. Output
tco
A Clock to Output Delay
tcf2
— Clock to Feedback Delay
tsu1
— Setup Time, Input or Fdbk before Clk ↑
tsu
2
— Setup Time, SP before Clock ↑
th
— Hold Time, Input or Fdbk after Clk ↑
A Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
fmax3
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
A Maximum Clock Frequency with
No Feedback
twh
— Clock Pulse Duration, High
twl
— Clock Pulse Duration, Low
ten
B Input or I/O to Output Enabled
tdis
C Input or I/O to Output Disabled
tar
A Input or I/O to Asynch. Reset of Reg.
tarw — Asynchronous Reset Pulse Duration
tarr
— Asynch. Reset to Clk↑ Recovery Time
tspr
— Synch. Preset to Clk ↑ Recovery Time
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Specification section.
3) Refer to fmax Specification section.
COM
-7
MIN. MAX.
1 7.5
IND
-10
UNITS
MIN. MAX.
1
10
ns
1 4.5 1
7
ns
— 2.5 — 2.5 ns
6—7
—
ns
6—7
—
ns
0—0 —
95.2 — 71.4 —
ns
MHz
117.6 — 105 — MHz
142.8 — 105 — MHz
3.5 — 4
—
ns
3.5 — 4
—
ns
1 7.5 1
10
ns
1 7.5 1
9
ns
1
9
1
13
ns
7—8
—
ns
5—8
—
ns
5 — 10 —
ns
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
C
Input Capacitance
I
CI/O
I/O Capacitance
*Characterized but not 100% tested.
MAXIMUM*
8
8
UNITS
pF
pF
TEST CONDITIONS
V = 5.0V, V = 2.0V
CC
I
VCC = 5.0V, VI/O = 2.0V
7
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