FVXO-LC53 Просмотр технического описания (PDF) - Fox Electronics

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FVXO-LC53

LVDS 5 x 3.2mm 3.3V VCXO

Fox Electronics 

FVXO-LC53 Series

Phase Noise

0 dBc

-10dBc

-20dBc

-30dBc

-40dBc

-50dBc

212.5 MHz

-60dBc

622.08 MHz

-70dBc

-80dBc

-90dBc

62.5 MHz

-100dBc

-110dBc

-120dBc

-130dBc

-140dBc

-150dBc

-160dBc

10

100

Phase Noise Graph

(dBc / Hz) vs. offset frequency

FOUR frequencies matching

the below jitter measurements

Data Collected using HP 3048A

156.25MHz

62.5 MHz

1k

10k

100k

1M

Offset Frequency (10Hz to 40MHz)

622.08 MHz

156.25MHz

212.5 MHz

10M 40M

Jitter is frequency dependent. Below are typical values at select frequencies.

LVDS Phase Jitter & Time Interval Error (TIE)

Frequency

Phase Jitter

(12kHz to 20MHz)

TIE

(Sigma of Jitter Distribution)

Units

62.5 MHz

0.77

3.0

pS RMS

156.25 MHz

1.19

3.6

pS RMS

212.5 MHz

0.89

622.08MHz

0.99

3.9

pS RMS

3.2

pS RMS

Phase Jitter is integrated from HP3048 Phase Noise Measurement System; measured directly into 50 ohm input; VDD = 3.3V.

TIE was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; VDD = 3.3V.

Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)

LVDS Random & Deterministic Jitter Composition

Random (Rj) Deterministic (Dj)

Frequency

(pS RMS)

(pS P-P)

Total Jitter (Tj)

(14 x Rj) + Dj

62.5 MHz

1.3

7.0

24.9 pS

156.25 MHz

1.3

5.8

23.6 pS

212.5 MHz

0.9

6.7

622.08 MHz

1.1

5.3

18.7 pS

20.7 pS

Rj and Dj, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.

Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)

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