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CY7C29 Просмотр технического описания (PDF) - Cypress Semiconductor

Номер в каталоге
Компоненты Описание
производитель
CY7C29
Cypress
Cypress Semiconductor Cypress
CY7C29 Datasheet PDF : 17 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
CY7C419/21/25/29/33
Maximum Rating
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.[1]
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with Power Applied.. –55°C to +125°C
Supply Voltage to Ground Potential................–0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ................................................–0.5V to +7.0V
DC Input Voltage ............................................–0.5V to +7.0V
Output Current, into Outputs (LOW)............................ 20 mA
Static Discharge Voltage............................................ >2000V
(per MIL–STD–883, Method 3015)
Latch-Up Current ..................................................... >200 mA
Operating Range
Range
Commercial
Ambient Temperature[2]
0°C to + 70°C
VCC
5V ± 10%
Industrial
–40°C to +85°C
5V ± 10%
Power Dissipation.......................................................... 1.0W
Electrical Characteristics Over the Operating Range[3]
Parameter
Description
Test Conditions
All Speed Grades
Min
Max
Unit
VOH
Output HIGH Voltage
VCC = Min., IOH = –2.0 mA
2.4
VOL
Output LOW Voltage
VCC = Min., IOL = 8.0 mA
VIH
Input HIGH Voltage
Commercial
2.0
Industrial
2.2
VIL
Input LOW Voltage
[4]
IIX
Input Leakage Current
GND < VI < VCC
–10
IOZ
Output Leakage Current
R > VIH, GND < VO < VCC
–10
IOS
Output Short Circuit Current[5] VCC = Max., VOUT = GND
V
0.4
V
VCC
V
VCC
0.8
V
+10
μA
+10
μA
–90
mA
Notes
1. Single Power Supply: The voltage on any input or I/O pin can not exceed the power pin during power-up.
2. TA is the “instant on” case temperature.
3. See the last page of this specification for Group A subgroup testing information.
4. VIL (Min.) = –2.0V for pulse durations of less than 20 ns.
5. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
Document #: 38-06001 Rev. *C
Page 3 of 17
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