CXD2932AGA-2 Просмотр технического описания (PDF) - Sony Semiconductor

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Компоненты Описание

производитель

CXD2932AGA-2

GPS Base Band LSI

Sony Semiconductor 

Pin Description

Pin

No.

Symbol

1 VSS9

2 PORT2

3 PORT3

4 PORT4

5 PORT5

6 PORT6

7 PORT7

8 VDD9

9 PORT8

10 PORT9

11 PORT10

12 PORT11

13 PORT12

14 PORT13

15 VSS10

16 PORT14

17 PORT15

18 TXD0

19 RXD0

20 TXD1

21 RXD1

22 VDD10

23 IFI

24 IFO

25 TEST0

26 TEST1

27 CCKI

28 CCKO

29 VSS11

30 REFCK

31 TRST

32 TCK

33 TDI

34 TDO

35 TMS

36 VDD11

37 AVD2

I/O

Description

— VSS

I/O/Z I/O port 2 (See the Application Circuit for setting.)

I/O/Z I/O port 3 (See the Application Circuit for setting.)

I/O/Z I/O port 4 (See the Application Circuit for setting.)

I/O/Z I/O port 5 (See the Application Circuit for setting.)

I/O/Z I/O port 6 (See the Application Circuit for setting.)

I/O/Z I/O port 7 (See the Application Circuit for setting.)

— VDD

I/O/Z I/O port 8 (See the Application Circuit for setting.)

I/O/Z I/O port 9 (See the Application Circuit for setting.)

I/O/Z I/O port 10 (See the Application Circuit for setting.)

I/O/Z I/O port 11 (See the Application Circuit for setting.)

I/O/Z I/O port 12 (See the Application Circuit for setting.)

I/O/Z I/O port 13 (See the Application Circuit for setting.)

— VSS

I/O/Z I/O port 14

I/O/Z I/O port 15

O/Z UART transmission data (CH0)

I UART reception data (CH0)

O/Z UART transmission data (CH1)

I UART reception data (CH1)

— VDD

I

IF signal binary conversion circuit

O

I Test (Low level fixed)

I Test (Low level fixed)

I

Timer oscillation circuit (32.768kHz ± 100ppm)

O

— VSS

I Test (Low level fixed)

I Test (Open)

I Test (Open)

I Test (Open)

O/Z Test

I Test (Open)

— VDD

— A/D converter VDD

–5–

CXD2932AGA-2

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