CM1241 Просмотр технического описания (PDF) - ON Semiconductor

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Компоненты Описание

производитель

CM1241

4-Channel Low Capacitance Dual-Voltage ESD Protection Array

ON Semiconductor 

Typical Application

CM1241

*Standard test condition is IEC61000-4-2 level 4 test circuit with each pin subjected to ±8kV contact discharge for 1000 pulses. Discharges are timed at 1 second intervals and all 1000 strikes are completed in one continuous

test run. The part is then subjected to standard production test to verify that all of the tested parameters are within spec after the 1000 strikes.

Package / Pinout Diagrams

Rev. 3 | Page 2 of 14 | www.onsemi.com

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