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CM1233 Просмотр технического описания (PDF) - California Micro Devices Corp

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CM1233 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
CM1233
IEC 6100-4-2
Test Standards
Standard
ESD Device
Standard ESD
Device Test Setup
Voltage
Probe
Device Under
Protection (DUP)
RVARIABLE
IEC 6100-4-2
Test Standards
CM1233
Current
Probe
IRESIDUAL
CM1233 Test Setup
Voltage
Probe
Device Under
Protection (DUP)
RVARIABLE
Current
Probe
IRESIDUAL
Figure 6. Test Setups: Standard Device (Left) and CM1233 (Right)
100.0Ω
Time (100.0ps /div)
Figure 7. Typical Channel TDR Measured Across Out_x and In_x Per Each Differential Channels Pair
(Typical 200ps Incident Rise Time)
© 2008 California Micro Devices Corp. All rights reserved.
490 N. McCarthy Blvd., Milpitas, CA 95035-5112 Tel: 408.263.3214 Fax: 408.263.7846 www.cmd.com
7
Issue A – 03/18/08

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