DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

C9827H Просмотр технического описания (PDF) - Cypress Semiconductor

Номер в каталоге
Компоненты Описание
производитель
C9827H Datasheet PDF : 25 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Approved Product
C9827H
High Performance Pentium® 4 Clock Synthesizer
AC Parameters (Cont.)
66 MHz
Symbol Parameter
Min Max
TDC
REF Duty Cycle
45
55
TPeriod REF period
69.8413 71.0
Tr / Tf
REF rise and fall
1.0
4.0
times
TCCJ
REF Cycle to
-
1000
Cycle Jitter
100 MHz
Min Max
45
55
69.8413 71.0
1.0
4.0
-
1000
133 MHz
Min Max
45
55
69.8413 71.0
1.0
4.0
-
1000
200 MHz
Min Max
45
55
69.8413 71.0
1.0
4.0
-
1000
Units
%
nS
nS
pS
Notes
2, 4
2, 4
2, 3
2, 4
tpZL, tpZH Output enable
1.0
10.0
1.0
10.0
1.0
10.0
1.0
10.0
nS
11
delay (all outputs)
tpLZ, tpZH Output disable
1.0
10.0
1.0
10.0
1.0
10.0
1.0
10.0
nS
11
delay (all outputs)
tstable All clock
-
3
-
3
-
3
-
3
mS
11
Stabilization from
power-up
tss
Stopclock Set Up
10.0
-
10.0
-
10.0
-
10.0
-
nS
10
Time
tsh
Stopclock Hold
0
-
0
-
0
-
0
-
nS
10
Time
tsu
Oscillator startup
-
X
-
X
-
X
-
X
mS
12
time
(VDD = VDDA = 3.3V ±5%, TA = 0°C to +70°C)
Note 1: This parameter is measured as an average over 1uS duration, with a crystal center frequency of 14.31818MHz
Note 2: All outputs loaded as per table 5 below.
Note 3: Probes are placed on the pins, and measurements are acquired between 0.4V and 2.4V for 3.3V signals (see test and measurement
setup section of this data sheet)
Note 4: Probes are placed on the pins, and measurements are acquired at 1.5V for 3.3V signals (see test and measurement setup section of this
data sheet).
Note 5: This measurement is applicable with Spread ON or Spread OFF.
Note 6: Measured from Vol = 0.175V to Voh = 0.525V.
Note 7: Measurements taken from common mode waveforms, measure rise/fall time from 0.41 to 0.86V. Rise/fall time matching is defined as “the
instantaneous difference between maximum clk rise (fall) and minimum clk# fall (rise) time, or minimum clk rise (fall) and maximum clk#
fall (rise) time”. This parameter is designed form waveform symmetry.
Note 8: The time specified is measured from when all VDD’s reach their supply rail (3.3V) till the frequency output is stable and operating within
the specifications.
Note 9: Measured from when both SEL1 and SEL0 are low
Note 10: CPU_STP# and PCI_STP# setup time with respect to any PCI_F clock to guarantee that the effected clock will stop or start at the next
PCI_F clock’s rising edge.
Note 11: When Xin is driven from an external clock source.
Note 12: When Crystal meets minimum 40 ohm device series resistance specification.
Note 13: Measured between 0.2Vdd and .7Vdd
Note 14: This is required for the duty cycle on the REF clock out to be as specified. The device will operate reliably with input duty cycles up to
30/70 but the REF clock duty cycle will not be within data sheet specifications.
Note 15: Vpullup(external)=1.5V, Min=(Vpullup(external)/2)-150mV, Max=(Vpullup(external)/2)+150mV
Note 16: Vp = V pull-up (external), Vdif specifies the minimum input differential voltage (Vtr-Vcp) required for switching, where Vtr is the true input
level and Vcp is the compliment input level.
Note 17: Measured at crossing point (Vx) or where subtraction of CLK-CLK# crosses 0 volts.
Note 18: This figure is additive to any jitter already present when the 66IN pin is being used as an input. Otherwise a 500 ps jitter figure is
specified.
Note 19: THIGH is measured at 2.4V for non host outputs.
Note 20: TLOW is measured at 0.4V for all outputs.
Note 21: Determined as a fraction of 2*(Trise-Tfall)/ (Trise+Tfall).
Note 22: Test load is Rta=33.2 ohms, Rd=49.9 ohms.
Note 23: These crossing points refer to only crossing points containing a rising edge of a Host output.
Note 24: This measurement refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing.
Note 25: Measurement taken from differential waveform, from –0.35V to +0.35V.
Note 26: Measured in absolute voltage, i.e. single-ended measurement.
Cypress Semiconductor Corporation
http://www.cypress.com
Document#: 38-07106 Rev. *A
12/26/2002
Page 9 of 25

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]