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74LVC86 Просмотр технического описания (PDF) - Philips Electronics

Номер в каталоге
Компоненты Описание
производитель
74LVC86
Philips
Philips Electronics Philips
74LVC86 Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
Philips Semiconductors
Quad 2-input EXCLUSIVE-OR gate
Product specification
74LVC86
LOGIC SYMBOL
1 1A
2 1B
4 2A
5 2B
9 3A
10 3B
12 4A
13 4B
1Y 3
2Y 6
3Y 8
4Y 11
LOGIC DIAGRAM (ONE GATE)
SV00480
FUNCTION TABLE
INPUTS
nA
nB
L
L
L
H
H
L
H
H
NOTES:
H = HIGH voltage level
L = LOW voltage level
OUTPUTS
nY
L
H
H
L
A
Y
B
SV00478
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VCC
VI
VI/O
VO
Tamb
tr, tf
DC supply voltage (for max. speed performance)
DC supply voltage (for low-voltage applications)
DC input voltage range
DC input voltage range for I/Os
DC output voltage range
Operating free-air temperature range
Input rise and fall times
CONDITIONS
VCC = 1.2 to 2.7V
VCC = 2.7 to 3.6V
LIMITS
MIN
MAX
2.7
3.6
1.2
3.6
0
5.5
0
VCC
0
VCC
–40
+85
0
20
0
10
UNIT
V
V
V
V
V
°C
ns/V
ABSOLUTE MAXIMUM RATINGS1
In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0V).
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage
–0.5 to +6.5
V
IIK
DC input diode current
VI t 0
–50
mA
VI
DC input voltage
Note 2
–0.5 to +5.5
V
VI/O
DC input voltage range for I/Os
–0.5 to VCC +0.5
V
IOK
DC output diode current
VO uVCC or VO t 0
"50
mA
VOUT DC output voltage
Note 2
–0.5 to VCC +0.5
V
IOUT
DC output source or sink current
VO = 0 to VCC
"50
mA
IGND, ICC DC VCC or GND current
"100
mA
Tstg
Storage temperature range
–60 to +150
°C
Power dissipation per package
PTOT – plastic mini-pack (SO)
above +70°C derate linearly with 8 mW/K
500
mW
– plastic shrink mini-pack (SSOP and TSSOP) above +60°C derate linearly with 5.5 mW/K
500
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1997 Mar 18
3

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