NXP Semiconductors
BLF878
UHF power LDMOS transistor
Table 8. Typical push-pull impedance …continued
Simulated Zi and ZL device impedance; impedance info at VDS = 42 V and PL(PEP) = 300 W.
f
Zi
ZL
MHz
Ω
Ω
925
5.103 + j4.467
3.706 − j0.871
950
5.656 + j4.291
3.556 − j1.011
975
6.205 + j3.963
3.415 − j1.157
1000
6.696 + j3.463
3.281 − j1.308
7.5 Reliability
106
Years
105
001aai087
104
(1)
(2)
(3)
103
(4)
(5)
(6)
102
(7)
(8)
(9)
(10)
10
(11)
1
0
4
8
12
16
20
24
IDS(DC) (A)
TTF (0.1 % failure fraction).
The reliability at pulsed conditions can be calculated as follows: TTF (0.1 %) × 1 / δ.
(1) Tj = 100 °C
(2) Tj = 110 °C
(3) Tj = 120 °C
(4) Tj = 130 °C
(5) Tj = 140 °C
(6) Tj = 150 °C
(7) Tj = 160 °C
(8) Tj = 170 °C
(9) Tj = 180 °C
(10) Tj = 190 °C
(11) Tj = 200 °C
Fig 13. BLF878 electromigration (IDS(DC), total device)
BLF878_2
Product data sheet
Rev. 02 — 15 June 2009
© NXP B.V. 2009. All rights reserved.
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