B57227K0333A001(2002) Просмотр технического описания (PDF) - EPCOS AG

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Компоненты Описание

производитель

B57227K0333A001
(Rev.:2002)

Temperature Measurement Probe Assemblies

EPCOS AG 

Temperature Measurement

Probe Assemblies

B57227

K 227

Reliability data

Test

Storage in

dry heat

Storage in damp

heat, steady state

Rapid temperature

cycling

Endurance

Long-term stability

(empirical value)

Standard

IEC

60068-2-2

IEC

60068-2-3

IEC

60068-2-14

Test conditions

∆R25/R25

(typical)

Storage at upper

category temperature

T: 125 °C

t: 1000 h

<2%

Temperature of air: 40 °C

Relative humidity of air: 93 %

Duration: 56 days

<1%

Lower test temperature: – 55 °C < 1 %

Upper test temperature: 155 °C

Number of cycles: 10

Pmax: 200 mW

t: 1000 h

<2%

T: 155 °C

t: 10 000 h

<3%

Remarks

No visible

damage

No visible

damage

No visible

damage

No visible

damage

No visible

damage

115 05/02

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