TC820CPL Просмотр технического описания (PDF) - TelCom Semiconductor Inc => Microchip

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TC820CPL

3-3/4 DIGIT A/D CONVERTER WITH FREQUENCY COUNTER AND LOGIC PROBE

TelCom Semiconductor Inc => Microchip 

3-3/4 DIGIT A/D CONVERTER WITH

FREQUENCY AND LOGIC PROBE

1

TC820

ABSOLUTE MAXIMUM RATINGS*

Supply Voltage (VDD to GND) .....................................15V

Analog Input Voltage (Either Input) (Note 1) .... VDD to VSS

Reference Input Voltage (Either Input) ............. VDD to VSS

Digital Inputs ............................................... VDD to DGND

VDISP ............................................. VDD to (DGND – 0.3V)

Package Power Dissipation (TA ≤ 70°C) (Note 2)

40-Pin Plastic DIP ............................................. 1.23W

44-Pin PLCC .....................................................1.23W

44-Pin Plastic Flat Package .............................. 1.00W

Operating Temperature Range

"C" Devices ............................................ 0°C to +70°C

"E" Devices ....................................... – 40°C to +85°C

Storage Temperature Range ................ – 65°C to +150°C

Lead Temperature (Soldering, 10 sec) ................... 300°C

*Static-sensitive devices. Unused devices should be stored in conductive

material to protect against static discharge and static fields. Stresses above

those listed under Absolute Maximum Ratings may cause permanent

damage to the device. These are stress ratings only, and functional

operation of the device at these or any other conditions above those

indicated in the operational sections of the specifications is not implied.

Exposure to absolute maximum rating conditions for extended periods may

affect device reliability.

2

NOTES: 1. Input voltages may exceed the supply voltages provided that

input current is limited to ±100µA. Current above this value

may result in invalid display readings but will not destroy the

device if limited to ±1mA.

2. Dissipation ratings assume device is mounted with all leads

soldered to printed circuit board.

3

ELECTRICAL CHARACTERISTICS: VS = 9V, TA = 25°C, unless otherwise specified.

Symbol Parameter

Test Conditions

Min

Typ

RE

NL

CMRR

VCMR

eN

IIN

Zero Input Reading

Roll-Over Error

Nonlinearity (Maximum

Deviation From Best

Straight Line Fit)

Ratiometric Reading

Common-Mode Rejection

Ratio

Common-Mode Voltage

Range

Noise (P-P Value Not

Exceeded 95% of Time)

Input Leakage Current

VCOM

VCTC

TCZS

TCFS

Analog Common Voltage

Common Voltage

Temperature Coefficient

Zero Reading Drift

Scale Factor

Temperature Coefficient

IS

Supply Current

Peak-to-Peak Backplane

Drive Voltage

VIN = 0V

Full Scale = 400 mV

VIN = ±390mV

Full-Scale = 400mV

Full-Scale = 400mV

– 000

–1

–1

±000

±0.2

±0.2

VIN = VREF, TC820

VCM = ±1V, VIN = 0V

Full-Scale = 400mV

(VFS = 200 mV)

Input High, Input Low

VIN = 0V

Full-Scale = 400mV

VIN = 0V

TA = 25°C

0°C ≤ TA ≤ +70°C

– 40°C ≤ TA ≤ +85°C

25 kΩ Between Common and VDD

(VSS – VCOM)

25 kΩ Between Common and VDD

0°C ≤ TA ≤ +70°C

– 40°C ≤ TA ≤ +85°C

VIN = 0V

0°C ≤ TA ≤ +70°C

– 40°C ≤ TA ≤ +85°C

VIN = 399mV

0°C ≤ TA ≤ +70°C

– 40°C ≤ TA ≤ +85°C

Ext Ref = 0 ppm/°C

VIN = 0V

VS = 9V

VDISP = DGND

1999 1999/2000

—

50

VSS + 1.5

—

—

15

—

1

—

20

—

100

3.15

3.3

—

35

—

50

—

0.2

1

—

1

—

5

—

1

4.25

4.7

Max

+000

+1

+1

2000

—

VDD– 1

—

10

—

—

3.45

50

—

—

5

—

1.5

5.3

Units

Digital

Reading

Counts

Count

Digital

µV/V

V

µV

pA

V

ppm/°C

µV/°C

ppm/°C

mA

V

4

5

6

7

8

TELCOM SEMICONDUCTOR, INC.

3-151

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