4.4 Input Test Waveforms
4.4.1 Input Test Waveforms and Measurement Levels
4.4.2
tR, tF < 1.5 ns (10% to 90%)
Output Test Loads
4.4.3
Note:
Similar devices are tested with slightly different loads. These load differences may affect output
signals' delay and slew rate. Atmel devices are tested with sufficient margins to meet compatible
devices.
Pin Capacitance
Table 4-1. Pin Capacitance (f = 1 MHz, T = 25°C(1))
Typ
Max
Units
Conditions
CIN
COUT
5
8
pF
6
8
pF
VIN = 0V
VOUT = 0V
Note: 1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100%
tested.
6 ATF16V8CZ
0453H–PLD–7/05