ATC18 Просмотр технического описания (PDF) - Atmel Corporation

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ATC18

Cell-based ASIC

Atmel Corporation 

1.1 Absolute Maximum Ratings

Operation of a device outside the range given in Table 1-2 may cause permanent damage to the

device and/or affect reliability.

Table 1-2. Absolute Maximum Ratings

Symbol Parameter

VDD

VDD2.5

VDD3.3

VI

VI

DC Supply Voltage

DC Supply voltage

DC Supply Voltage

DC Input Voltage,1.8V I/Os

DC Input Voltage, 3.3V I/Os

VO

DC Output Voltage, 1.8V I/Os

VO

DC Output Voltage, 3.3V I/Os

TEMP

Operating Free Air Temperature

Range

TSG

Storage Temperature

Conditions

Core

2.5V Interface I/Os

3.3V Interface I/Os

Industrial

Min

Max

Unit

-0.3

2.0

V

-0.3

4.0

V

-0.3

4.0

V

-0.3

VDD + 0.3, 2.0 max

V

-0.3

VDD3.3 + 0.3, 4.0 max

V

-0.3

VDD+ 0.3, 2.0 max

V

-0.3

VDD3.3 + 0.3, 4.0 max

V

-40

+125

°C

-60

+150

°C

The Atmel cell libraries have been designed in order to be compatible with each other. Simula-

tion representations exist for three types of operating conditions. They correspond to the

characterization conditions defined as follows:

• MIN conditions (industrial best case):

TJ = -40° C

VDD(cell) = 1.95V

Process = fast

• TYP conditions (industrial typical case):

TJ = +25° C

VDD(cell) = 1.8V

Process = typ

• MAX conditions (industrial worst case):

TJ = +100° C

VDD(cell) = 1.60V

Process = slow

Delays to tristate are defined as delay to turn off (VGS < VT) of the driving devices.

Output pad drain current corresponds to the output current of the pad when the output voltage is

VOL or VOH. The output resistor of the pad and the voltage drop due to access resistors (in and

out of the die) are taken into account. In order to have accurate timing estimates, all character-

ization has been run on electrical netlists extracted from the layout database.

2 ATC18 Summary

1389CS–CASIC–06-Nov-06

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