AT89C51RC2(2002) Просмотр технического описания (PDF) - Atmel Corporation

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Компоненты Описание

производитель

AT89C51RC2
(Rev.:2002)

FLASH C51 Microcontrollers

Atmel Corporation 

AT89C51RB2 / RC2 & T89C51IC2 QualPack

4.4.2 AT89C51RB2 / RC2 & T89C51IC2 reliability calculation

In the next table, it is proposed a AT89C51RC2 reliability prediction calculated at 55°c for 60% confidence level

from generic test data collected during the 12 last months process monitor.

Lots

A00151S

A00712

A00588A

A00498A

A00637B

A00330K

A00365J

A00470K

Global

Device Type Test Description

Step Result Comment

T89C51CC01

TQFP 44

EFR Dynamic Life Test 48h

LFR Life Test

1000h

1/809

0/264

1 Icc drift caused by a contact

particle

T89C51RC2

PLCC 44

EFR Dynamic Life Test 48h

LFR Life Test

1000h

1/616

0/200

1 Ipd drift caused by an

interlayer oxide thinning

T83C51IC2

PLCC 44

EFR Dynamic Life Test 48h 0/300

LFR Life Test

1000h 0/200

T89C51CC02 LFR Life Test

SOW 28

168h 0/100

All products EFR Dynamic Life Test 48h 2/1725 1159 ppm

LFR Life Test

-

0/764 8 fit

Rev. 1 – 2002 June

19

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