AT29LV256 Просмотр технического описания (PDF) - Atmel Corporation
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AT29LV256 Datasheet PDF : 10 Pages
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AT29LV256
AC Read Characteristics
Symbol
tACC
tCE (1)
tOE (2)
tDF (3, 4)
tOH
Parameter
Address to Output Delay
CE to Output Delay
OE to Output Delay
CE or OE to Output Float
Output Hold from OE, CE or
Address, whichever occurred first
AC Read Waveforms (1, 2, 3, 4)
AT29LV256-15
Min
Max
150
150
0
70
0
40
0
AT29LV256-20
Min
Max
200
200
0
100
0
50
0
AT29LV256-25
Min
Max
250
250
0
120
0
60
0
Units
ns
ns
ns
ns
ns
Notes:
1. CE may be delayed up to tACC - tCE after the address transi-
tion without impact on tACC .
2. OE may be delayed up to tCE - tOE after the falling edge
of CE without impact on tCE or by tACC - tOE after an address
change without impact on tACC .
3. tDF is specified from OE or CE whichever occurs first
(CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and Measurement Level
Output Test Load
tR, tF < 5 ns
Pin Capacitance (f = 1 MHz, T = 25°C) (1)
Typ
Max
CIN
4
6
COUT
8
12
Note: 1. These parameters are characterized and not 100% tested.
Units
pF
pF
Conditions
VIN = 0V
VOUT = 0V
4-37
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