APM3055LUV Просмотр технического описания (PDF) - Anpec Electronics
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производитель
APM3055LUV Datasheet PDF : 9 Pages
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APM3055L
R eliab ility test p rog ram
Test item
SO LD ER A BILITY
H O LT
PCT
TST
ESD
Latch-U p
M ethod
M IL-S T D -883D -2003
M IL-S T D -883D -1005.7
JESD-22-B, A102
M IL -S T D -8 83 D -1 0 11 .9
M IL-S T D -883D -3015.7
JESD 78
Carrier Tape
Po
P
E
P1
D escription
245°C , 5 SEC
1000 H rs Bias @ 125 °C
168 Hrs, 100 % RH , 121°C
-6 5°C ~ 1 5 0°C , 20 0 C yc le s
V H B M > 2K V, V M M > 200V
10m s , Itr > 1 00m A
t
D
F
Bo
W
Ko
Ao
D1
T2
J
C
A
B
T1
Application
TO-252
A
330 ±3
F
B
100 ± 2
D
C
13 ± 0. 5
D1
J
2 ± 0.5
Po
T1
16.4 + 0.3
-0.2
P1
T2
2.5± 0.5
Ao
W
16+ 0.3
- 0.1
Bo
P
8 ± 0.1
Ko
E
1.75± 0.1
t
Application
SOT-223
7.5 ± 0.1
A
330±1
F
1.5 +0.1
B
62±1.5
D
1.5± 0.25 4.0 ± 0.1 2.0 ± 0.1 6.8 ± 0.1 10.4± 0.1
C
12.75±
0.15
D1
J
2 ± 0.6
Po
T1
12.4 +0.2
P1
T2
2± 0.2
Ao
W
12 ± 0.3
Bo
2.5± 0.1
P
8 ± 0.1
Ko
0.3±0.05
E
1.75± 0.1
t
5.5 ± 0.05 1.5+ 0.1 1.5+ 0.1 4.0 ± 0.1 2.0 ± 0.05 6.9 ± 0.1 7.5± 0.1 2.1± 0.1 0.3±0.05
Copyright ANPEC Electronics Corp.
8
Rev. A.6 - Apr., 2002
www.anpec.com.tw
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