AP2127K-4.75G1 Просмотр технического описания (PDF) - BCD Semiconductor

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AP2127K-4.75G1

300mA HIGH SPEED, EXTREMELY LOW NOISE CMOS LDO REGULATOR

BCD Semiconductor 

Data Sheet

300mA HIGPHreSPlimEEinDa,rEyXDTaRtaEsMheEeLtY LOW NOISE CMOS LDO REGULATOR

AP2127

Absolute Maximum Ratings (Note 1)

Parameter

Input Voltage

Shutdown Input Voltage

Output Current

Junction Temperature

Storage Temperature Range

Lead Temperature (Soldering, 10sec)

Thermal Resistance

ESD (Human Body Model)

ESD (Machine Model)

Symbol

VIN

VCE

IOUT

TA

TSTG

TLEAD

θ JA

ESD

ESD

Value

6.5

-0.3 to VIN+0.3

450

150

-65 to 150

260

250

6000

250

Unit

V

V

mA

oC

oC

oC

oC/W

V

V

Note 1: Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.

These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated

under "Recommended Operating Conditions" is not implied. Exposure to "Absolute Maximum Ratings" for extended periods

may affect device reliability.

Recommended Operating Conditions

Parameter

Input Voltage

Operating Junction Temperature Range

Symbol

VIN

TA

Min

Max

Unit

2.5

6

V

-40

85

oC

Oct. 2009 Rev. 1. 3

BCD Semiconductor Manufacturing Limited

5

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