CY7C1352 Просмотр технического описания (PDF) - Cypress Semiconductor

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CY7C1352

256K x18 Pipelined SRAM with NoBL™ Architecture

Cypress Semiconductor 

Capacitance[10]

Parameter

CIN

CCLK

CI/O

Description

Input Capacitance

Clock Input Capacitance

Input/Output Capacitance

Test Conditions

TA = 25°C, f = 1 MHz,

VDD = 3.3V.

VDDQ = 3.3V

CY7C1352

Max.

4

4

4

Unit

pF

pF

pF

AC Test Loads and Waveforms

OUTPUT

Z0 =50Ω

3.3V

OUTPUT

RL =50Ω

5 pF

VL = 1.5V

(a)

INCLUDING

JIG AND

SCOPE

R=317Ω

R=351Ω GND

(b)

1352-2

[11]

ALL INPUT PULSES

3.0V

Thermal Resistance

Description

Test Conditions

Symbol

TQFP Typ. Units Notes

Thermal Resistance

Still Air, soldered on a 4.25 x 1.125 inch,

ΘJA

(Junction to Ambient) 4-layer printed circuit board

28

°C/W

10

Thermal Resistance

(Junction to Case)

ΘJC

4

°C/W

10

Note:

10. Tested initially and after any design or process change that may affect these parameters.

11. A/C test conditions assume signal transition time of 2 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading shown in

(a) of AC Test Loads and Waveforms.

7

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