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27C256-15/SO(2004) Просмотр технического описания (PDF) - Microchip Technology

Номер в каталоге
Компоненты Описание
производитель
27C256-15/SO
(Rev.:2004)
Microchip
Microchip Technology Microchip
27C256-15/SO Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
27C256
TABLE 1-3: READ OPERATION AC CHARACTERISTICS
AC Testing Waveform: VIH = 2.4V and VIL = 0.45V; VOH = 2.0V VOL = 0.8V
Output Load:
1 TTL Load + 100 pF
Input Rise and Fall Times: 10 ns
Ambient Temperature: Commercial:
Tamb = 0°C to +70°C
Industrial:
Tamb = -40°C to +85°C
Automotive:
Tamb = -40°C to +125°C
Parameter
27C256-90* 27C256-10* 27C256-12 27C256-15 27C256-20
Sym
Units Conditions
Min Max Min Max Min Max Min Max Min Max
Address to Output tACC — 90 — 100 — 120 — 150 — 200
Delay
CE to Output Delay tCE — 90 — 100 — 120 — 150 — 200
OE to Output Delay tOE — 40 — 45 — 55 — 65 — 75
CE or OE to O/P
High Impedance
tOFF 0 30 0 30 0 35 0 50 0 55
Output Hold from tOH 0 — 0 — 0 — 0 — 0 —
Address CE or OE,
whichever goes first
* -10, -90 AC Testing Waveform: VIH = 2.4V and VIL = .45V; VOH = 1.5V and VOL = 1.5V
Output Load: 1 TTL Load + 30pF
ns CE=OE =VIL
ns OE = VIL
ns CE = VIL
ns
ns
FIGURE 1-1: READ WAVEFORMS
V IH
Address
V IL
V IH
CE
V IL
V IH
OE
V IL
Outputs
O0 - O7
VOH
VOL
High Z
Address Valid
t CE(2)
t OE(2)
t ACC
t OFF(1,3)
t OH
Valid Output
High Z
Notes: (1) t OFF is specified for OE or CE, whichever occurs first
(2) OE may be delayed up to t CE - t OE after the falling edge of CE without impact on t CE
(3) This parameter is sampled and is not 100% tested.
2004 Microchip Technology Inc.
DS11001N-page 3

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